Stephan Weiss

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Rodgau, DE

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Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS
- Publication number 20240377186
- Publication date Nov 14, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20240310159
- Publication date Sep 19, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL MEASURING SYSTEM FOR HIGH-SPEED DISTANCE MEASURE...
- Publication number 20240167808
- Publication date May 23, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL MEASURING DEVICE
- Publication number 20230417533
- Publication date Dec 28, 2023
- PRECITEC OPTRONIK GMBH
- Christoph Dietz
- G01 - MEASURING TESTING