Stephane Dana

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Tel Aviv, IL

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Patents Grantslast 30 patents

Information Patent Grant
Track-based metrology method and apparatus
- Patent number 8,513,625
- Issue date Aug 20, 2013
- Applied Materials, Inc.
- Stephane Dana
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AFM-based lithography metrology tool
- Patent number 6,392,229
- Issue date May 21, 2002
- Applied Materials, Inc.
- Stephane Dana
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
AFM-based lithography metrology tool
- Publication number 20050205776
- Publication date Sep 22, 2005
- APPLIED MATERIALS, INC.
- Stephane Dana
- G01 - MEASURING TESTING
Information Patent Application
AFM-based lithography metrology tool
- Publication number 20020158197
- Publication date Oct 31, 2002
- APPLIED MATERIALS, INC.
- Stephane Dana
- B82 - NANO-TECHNOLOGY