Stephanie Chen

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optimization-based image processing for metrology
- Patent number 12,050,408
- Issue date Jul 30, 2024
- Applied Materials, Inc.
- Waheb Bishara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Context-based inspection for dark field inspection
- Patent number 9,715,725
- Issue date Jul 25, 2017
- KLA-Tencor Corp.
- Yong Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmentation for wafer inspection
- Patent number 8,831,334
- Issue date Sep 9, 2014
- KLA-Tencor Corp.
- Tao Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 8,775,101
- Issue date Jul 8, 2014
- KLA-Tencor Corp.
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for creati...
- Patent number 8,135,204
- Issue date Mar 13, 2012
- KLA-Tencor Technologies Corp.
- Chien-Huei (Adam) Chen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for select...
- Patent number 8,049,877
- Issue date Nov 1, 2011
- KLA-Tencor Corp.
- Richard Wallingford
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for determ...
- Patent number 8,000,905
- Issue date Aug 16, 2011
- KLA-Tencor Technologies Corp.
- Stephanie Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating information to be used for selec...
- Patent number 8,000,922
- Issue date Aug 16, 2011
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTIMIZATION-BASED IMAGE PROCESSING FOR METROLOGY
- Publication number 20240385532
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- Waheb Bishara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEMPLATE-BASED IMAGE PROCESSING FOR TARGET SEGMENTATION AND METROLOGY
- Publication number 20230237762
- Publication date Jul 27, 2023
- Applied Materials, Inc.
- Xinhuo Xiao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION-BASED IMAGE PROCESSING FOR METROLOGY
- Publication number 20220163898
- Publication date May 26, 2022
- Applied Materials, Inc.
- Waheb Bishara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Context-Based Inspection for Dark Field Inspection
- Publication number 20150178907
- Publication date Jun 25, 2015
- KLA-Tencor Corporation
- Yong Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Segmentation for Wafer Inspection
- Publication number 20130188859
- Publication date Jul 25, 2013
- KLA-Tencor Corporation
- Tao Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS ON A WAFER
- Publication number 20130035876
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...
- Publication number 20090299681
- Publication date Dec 3, 2009
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...
- Publication number 20090284733
- Publication date Nov 19, 2009
- Richard Wallingford
- G01 - MEASURING TESTING

Stephanie Chen

Person

Patents Grantslast 30 patents

Optimization-based image processing for metrology

Context-based inspection for dark field inspection

Segmentation for wafer inspection

Detecting defects on a wafer

Computer-implemented methods, carrier media, and systems for creati...

Computer-implemented methods, carrier media, and systems for select...

Computer-implemented methods, carrier media, and systems for determ...

Methods and systems for generating information to be used for selec...

Patents Applicationslast 30 patents

OPTIMIZATION-BASED IMAGE PROCESSING FOR METROLOGY

TEMPLATE-BASED IMAGE PROCESSING FOR TARGET SEGMENTATION AND METROLOGY

OPTIMIZATION-BASED IMAGE PROCESSING FOR METROLOGY

Context-Based Inspection for Dark Field Inspection

Segmentation for Wafer Inspection

DETECTING DEFECTS ON A WAFER

METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...

COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...