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Stephanus H.L. van den Boom
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Geldrop, NL
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Patents Grants
last 30 patents
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Patent Grant
Method of investigating the wavefront of a charged-particle beam
Patent number
9,202,670
Issue date
Dec 1, 2015
FEI Company
Bart Jozef Janssen
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
Patent number
8,757,873
Issue date
Jun 24, 2014
FEI Company
Stephanus Hubertus Leonardus van den Boom
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM
Publication number
20150170876
Publication date
Jun 18, 2015
FEI Company
Bart Jozef Janssen
H01 - BASIC ELECTRIC ELEMENTS