Stephen A. Meisner

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St. Cloud, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Overlay metrology using scatterometry profiling
- Patent number 6,985,229
- Issue date Jan 10, 2006
- Agere Systems, INC
- Cynthia C. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling linewidth in photolithography suitable for us...
- Patent number 6,225,134
- Issue date May 1, 2001
- Lucent Technologies, Inc.
- Stephen A. Meisner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY