Membership
Tour
Register
Log in
Stephen B. Segall
Follow
Person
Ann Arbor, MI, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Laser probe for use in an inspection system
Patent number
9,581,556
Issue date
Feb 28, 2017
Industrial Optical Measurement Systems, LLC
Stephen Barrett Segall
G01 - MEASURING TESTING
Information
Patent Grant
Laser inspection system
Patent number
9,134,232
Issue date
Sep 15, 2015
Industrial Optical Measurement Systems, LLC
Stephen Barrett Segall
G01 - MEASURING TESTING
Information
Patent Grant
Reconfigurable surface finish inspection apparatus for cylinder bor...
Patent number
7,027,145
Issue date
Apr 11, 2006
The Regents of the University of Michigan
Stephen B. Segall
G01 - MEASURING TESTING
Information
Patent Grant
Optical method and system for rapidly measuring relative angular al...
Patent number
6,674,521
Issue date
Jan 6, 2004
The Regents of the University of Michigan
Stephen B. Segall
G01 - MEASURING TESTING
Information
Patent Grant
X-ray detector with picosecond time resolution
Patent number
4,215,274
Issue date
Jul 29, 1980
KMS Fusion, Inc.
Stephen B. Segall
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION SYSTEM FOR ESTIMATING WALL FRICTION IN COMBUSTION ENGINES
Publication number
20180356288
Publication date
Dec 13, 2018
INDUSTRIAL OPTICAL MEASUREMENT SYSTEMS
Stephen Barrett Segall
G01 - MEASURING TESTING
Information
Patent Application
NON-CONTACT LASER INSPECTION SYSTEM
Publication number
20110080588
Publication date
Apr 7, 2011
INDUSTRIAL OPTICAL MEASUREMENT SYSTEMS
Stephen Barrett Segall
G01 - MEASURING TESTING
Information
Patent Application
Calibration of reconfigurable inspection machine
Publication number
20040263840
Publication date
Dec 30, 2004
Stephen B. Segall
G01 - MEASURING TESTING
Information
Patent Application
Reconfigurable surface finish inspection apparatus for cylinder bor...
Publication number
20040263855
Publication date
Dec 30, 2004
Stephen B. Segall
G01 - MEASURING TESTING