Stephen Bradley Ippolito

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Ossining, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for probing a wafer
- Patent number 9,310,429
- Issue date Apr 12, 2016
- GLOBALFOUNDRIES Inc.
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing a wafer
- Patent number 8,248,097
- Issue date Aug 21, 2012
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Angular spectrum tailoring in solid immersion microscopy for circui...
- Patent number 7,961,307
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Angular spectrum tailoring in solid immersion microscopy for circui...
- Patent number 7,826,045
- Issue date Nov 2, 2010
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR PROBING A WAFER
- Publication number 20120217974
- Publication date Aug 30, 2012
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUI...
- Publication number 20110037973
- Publication date Feb 17, 2011
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Probing a Wafer
- Publication number 20100253379
- Publication date Oct 7, 2010
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUI...
- Publication number 20090189630
- Publication date Jul 30, 2009
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING