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Stephen Campbell
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Hialeah, FL, US
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last 30 patents
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Patent Grant
Method and apparatus for providing primary coincidence correction d...
Patent number
4,009,443
Issue date
Feb 22, 1977
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for providing primary coincidence correction d...
Patent number
3,938,038
Issue date
Feb 10, 1976
Coulter Electronics, Inc.
Stephen K. Campbell
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for providing primary coincidence correction d...
Patent number
3,936,741
Issue date
Feb 3, 1976
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING