Stephen E. Greco

Person

Lagrangeville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple-depth trench interconnect technology at advanced semicondu...
- Patent number 10,169,525
- Issue date Jan 1, 2019
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Early overlay prediction and overlay-aware mask design
- Patent number 10,152,567
- Issue date Dec 11, 2018
- International Business Machines Corporation
- Stephen E. Greco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Early overlay prediction and overlay-aware mask design
- Patent number 9,940,429
- Issue date Apr 10, 2018
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple-depth trench interconnect technology at advanced semicondu...
- Patent number 9,710,592
- Issue date Jul 18, 2017
- International Business Machines Corporation
- Stephen E. Greco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interconnect level structures for confining stitch-induced via stru...
- Patent number 9,601,367
- Issue date Mar 21, 2017
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,455,186
- Issue date Sep 27, 2016
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stitch-derived via structures and methods of generating the same
- Patent number 9,454,631
- Issue date Sep 27, 2016
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dividing lithography exposure fields to improve semiconductor fabri...
- Patent number 9,424,388
- Issue date Aug 23, 2016
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,406,560
- Issue date Aug 2, 2016
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,385,038
- Issue date Jul 5, 2016
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect level structures for confining stitch-induced via stru...
- Patent number 9,373,538
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring metal line spacing in semiconductor devices
- Patent number 9,157,980
- Issue date Oct 13, 2015
- International Business Machines Corporation
- Thomas W. Dyer
- G01 - MEASURING TESTING
Information Patent Grant
Selective local metal cap layer formation for improved electromigra...
- Patent number 9,076,847
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of predicting problematic areas for lithography i...
- Patent number 9,075,944
- Issue date Jul 7, 2015
- Mentor Graphics Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reticle data decomposition for focal plane determination in lithogr...
- Patent number 9,058,457
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generation of design shapes for confining stitch-induced via struct...
- Patent number 8,806,393
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Stephen E. Greco
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
IC having viabar interconnection and related method
- Patent number 8,492,268
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of predicting problematic areas for lithography i...
- Patent number 8,484,586
- Issue date Jul 9, 2013
- Mentor Graphics Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC having viabar interconnection and related method
- Patent number 8,299,622
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of predicting problematic areas for lithography i...
- Patent number 8,239,789
- Issue date Aug 7, 2012
- International Business Machines Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, method and computer program product for fast simulation...
- Patent number 8,117,568
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Hua Xiang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integrated circuit fuse
- Patent number 8,053,862
- Issue date Nov 8, 2011
- International Business Machines Corporation
- Stephen E. Greco
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
System and method of predicting problematic areas for lithography i...
- Patent number 8,001,495
- Issue date Aug 16, 2011
- International Business Machines Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Via density change to improve wafer surface planarity
- Patent number 7,949,981
- Issue date May 24, 2011
- International Business Machines Corporation
- Stephen E. Greco
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Intersect area based ground rule for semiconductor design
- Patent number 7,941,780
- Issue date May 10, 2011
- International Business Machines Corporation
- Albrik Avanessian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser fuse structures for high power applications
- Patent number 7,701,035
- Issue date Apr 20, 2010
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dry etchback of interconnect contacts
- Patent number 7,645,700
- Issue date Jan 12, 2010
- International Business Machines Corporation
- Theodorus E. Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure to monitor arcing in the processing steps of metal layer...
- Patent number 7,612,371
- Issue date Nov 3, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect structure and process of making the same
- Patent number 7,488,679
- Issue date Feb 10, 2009
- International Business Machines Corporation
- Theodorus Eduardus Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure having recess with conductive metal
- Patent number 7,456,501
- Issue date Nov 25, 2008
- International Business Machines Corporation
- Cyprian Emeka Uzoh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
EARLY OVERLAY PREDICTION AND OVERLAY-AWARE MASK DESIGN
- Publication number 20180129774
- Publication date May 10, 2018
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE-DEPTH TRENCH INTERCONNECT TECHNOLOGY AT ADVANCED SEMICONDU...
- Publication number 20170277823
- Publication date Sep 28, 2017
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EARLY OVERLAY PREDICTION AND OVERLAY-AWARE MASK DESIGN
- Publication number 20160378904
- Publication date Dec 29, 2016
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIVIDING LITHOGRAPHY EXPOSURE FIELDS TO IMPROVE SEMICONDUCTOR FABRI...
- Publication number 20160180003
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE-DEPTH TRENCH INTERCONNECT TECHNOLOGY AT ADVANCED SEMICONDU...
- Publication number 20160042114
- Publication date Feb 11, 2016
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERCONNECT LEVEL STRUCTURES FOR CONFINING STITCH-INDUCED VIA STRU...
- Publication number 20160027687
- Publication date Jan 28, 2016
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STITCH-DERIVED VIA STRUCTURES AND METHODS OF GENERATING THE SAME
- Publication number 20150339422
- Publication date Nov 26, 2015
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20150255343
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20150255398
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20150255342
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RETICLE DATA DECOMPOSITION FOR FOCAL PLANE DETERMINATION IN LITHOGR...
- Publication number 20150143305
- Publication date May 21, 2015
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERCONNECT LEVEL STRUCTURES FOR CONFINING STITCH-INDUCED VIA STRU...
- Publication number 20140284813
- Publication date Sep 25, 2014
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...
- Publication number 20140203435
- Publication date Jul 24, 2014
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING METAL LINE SPACING IN SEMICONDUCTOR DEVICES
- Publication number 20140139236
- Publication date May 22, 2014
- International Business Machines Corporation
- Thomas W. Dyer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...
- Publication number 20130286370
- Publication date Oct 31, 2013
- Mentor Graphics Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...
- Publication number 20120254812
- Publication date Oct 4, 2012
- International Business Machines Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC HAVING VIABAR INTERCONNECTION AND RELATED METHOD
- Publication number 20120164758
- Publication date Jun 28, 2012
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...
- Publication number 20110184715
- Publication date Jul 28, 2011
- International Business Machines Corporation
- Timothy A. BRUNNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus, Method and Computer Program Product for Fast Stimulation...
- Publication number 20100077372
- Publication date Mar 25, 2010
- International Business Machines Corporation
- Hua Xiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC HAVING VIABAR INTERCONNECTION AND RELATED METHOD
- Publication number 20100032846
- Publication date Feb 11, 2010
- International Business Machines Corporation
- Dureseti Chidambarrao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIA DENSITY CHANGE TO IMPROVE WAFER SURFACE PLANARITY
- Publication number 20100031221
- Publication date Feb 4, 2010
- International Business Machines Corporation
- Stephen E. Greco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERSECT AREA BASED GROUND RULE FOR SEMICONDUCTOR DESIGN
- Publication number 20090265673
- Publication date Oct 22, 2009
- International Business Machines Corporation
- Albrik Avanessian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...
- Publication number 20090265679
- Publication date Oct 22, 2009
- International Business Machines Corporation
- Timothy A. Brunner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT FUSE
- Publication number 20080179709
- Publication date Jul 31, 2008
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRY ETCHBACK OF INTERCONNECT CONTACTS
- Publication number 20080088027
- Publication date Apr 17, 2008
- International Business Machines Corporation
- Theodorus E. Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCREASING ELECTROMIGRATION LIFETIME AND CURRENT DENSITY IN IC USIN...
- Publication number 20080026567
- Publication date Jan 31, 2008
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT STRUCTURE AND PROCESS OF MAKING THE SAME
- Publication number 20080026568
- Publication date Jan 31, 2008
- International Business Machines Corporation
- Theodorus Eduardus Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE TO MONITOR ARCING IN THE PROCESSING STEPS OF METAL LAYER...
- Publication number 20070164421
- Publication date Jul 19, 2007
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER FUSE STRUCTURES FOR HIGH POWER APPLICATIONS
- Publication number 20070120232
- Publication date May 31, 2007
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCREASING ELECTROMIGRATION LIFETIME AND CURRENT DENSITY IN IC USIN...
- Publication number 20070087555
- Publication date Apr 19, 2007
- International Business Machines Corporation
- Stephen E. Greco
- H01 - BASIC ELECTRIC ELEMENTS

Stephen E. Greco

Person

Patents Grantslast 30 patents

Multiple-depth trench interconnect technology at advanced semicondu...

Early overlay prediction and overlay-aware mask design

Early overlay prediction and overlay-aware mask design

Multiple-depth trench interconnect technology at advanced semicondu...

Interconnect level structures for confining stitch-induced via stru...

Selective local metal cap layer formation for improved electromigra...

Stitch-derived via structures and methods of generating the same

Dividing lithography exposure fields to improve semiconductor fabri...

Selective local metal cap layer formation for improved electromigra...

Selective local metal cap layer formation for improved electromigra...

Interconnect level structures for confining stitch-induced via stru...

Measuring metal line spacing in semiconductor devices

Selective local metal cap layer formation for improved electromigra...

System and method of predicting problematic areas for lithography i...

Reticle data decomposition for focal plane determination in lithogr...

Generation of design shapes for confining stitch-induced via struct...

IC having viabar interconnection and related method

System and method of predicting problematic areas for lithography i...

IC having viabar interconnection and related method

System and method of predicting problematic areas for lithography i...

Apparatus, method and computer program product for fast simulation...

Integrated circuit fuse

System and method of predicting problematic areas for lithography i...

Via density change to improve wafer surface planarity

Intersect area based ground rule for semiconductor design

Laser fuse structures for high power applications

Dry etchback of interconnect contacts

Structure to monitor arcing in the processing steps of metal layer...

Interconnect structure and process of making the same

Semiconductor structure having recess with conductive metal

Patents Applicationslast 30 patents

EARLY OVERLAY PREDICTION AND OVERLAY-AWARE MASK DESIGN

MULTIPLE-DEPTH TRENCH INTERCONNECT TECHNOLOGY AT ADVANCED SEMICONDU...

EARLY OVERLAY PREDICTION AND OVERLAY-AWARE MASK DESIGN

DIVIDING LITHOGRAPHY EXPOSURE FIELDS TO IMPROVE SEMICONDUCTOR FABRI...

MULTIPLE-DEPTH TRENCH INTERCONNECT TECHNOLOGY AT ADVANCED SEMICONDU...

INTERCONNECT LEVEL STRUCTURES FOR CONFINING STITCH-INDUCED VIA STRU...

STITCH-DERIVED VIA STRUCTURES AND METHODS OF GENERATING THE SAME

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

RETICLE DATA DECOMPOSITION FOR FOCAL PLANE DETERMINATION IN LITHOGR...

INTERCONNECT LEVEL STRUCTURES FOR CONFINING STITCH-INDUCED VIA STRU...

SELECTIVE LOCAL METAL CAP LAYER FORMATION FOR IMPROVED ELECTROMIGRA...

MEASURING METAL LINE SPACING IN SEMICONDUCTOR DEVICES

SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...

SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...

IC HAVING VIABAR INTERCONNECTION AND RELATED METHOD

SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...

Apparatus, Method and Computer Program Product for Fast Stimulation...

IC HAVING VIABAR INTERCONNECTION AND RELATED METHOD

VIA DENSITY CHANGE TO IMPROVE WAFER SURFACE PLANARITY

INTERSECT AREA BASED GROUND RULE FOR SEMICONDUCTOR DESIGN

SYSTEM AND METHOD OF PREDICTING PROBLEMATIC AREAS FOR LITHOGRAPHY I...

INTEGRATED CIRCUIT FUSE

DRY ETCHBACK OF INTERCONNECT CONTACTS

INCREASING ELECTROMIGRATION LIFETIME AND CURRENT DENSITY IN IC USIN...

INTERCONNECT STRUCTURE AND PROCESS OF MAKING THE SAME

STRUCTURE TO MONITOR ARCING IN THE PROCESSING STEPS OF METAL LAYER...

LASER FUSE STRUCTURES FOR HIGH POWER APPLICATIONS

INCREASING ELECTROMIGRATION LIFETIME AND CURRENT DENSITY IN IC USIN...