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Stephen E. Lipsky
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East Hills, NY, US
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last 30 patents
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Patent Grant
Method and apparatus for electrically scanning an antenna array in...
Patent number
4,313,117
Issue date
Jan 26, 1982
General Instrument Corporation
Stephen E. Lipsky
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for electrically scanning an antenna array in...
Patent number
4,257,047
Issue date
Mar 17, 1981
General Instrument Corporation
Stephen E. Lipsky
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synchronously tuning the multi-channel sup...
Patent number
4,214,316
Issue date
Jul 22, 1980
General Instrument Corporation
Stephen E. Lipsky
G01 - MEASURING TESTING
Information
Patent Grant
Direction finding apparatus
Patent number
3,987,446
Issue date
Oct 19, 1976
General Instrument Corporation
Stephen Lipsky
G01 - MEASURING TESTING