Stephen F. Blazo

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Frequency dithering for DDS spectral purity
- Patent number 6,785,345
- Issue date Aug 31, 2004
- Tektronix, Inc.
- Stephen F. Blazo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical signal jitter and wander measurement system and method
- Patent number 5,757,652
- Issue date May 26, 1998
- Tektronix, Inc.
- Stephen F. Blazo
- G01 - MEASURING TESTING
Information Patent Grant
Phase measurement apparatus and method
- Patent number 5,754,437
- Issue date May 19, 1998
- Tektronix, Inc.
- Stephen F. Blazo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal generator for generating a jitter/wander output
- Patent number 5,742,208
- Issue date Apr 21, 1998
- Tektronix, Inc.
- Stephen F. Blazo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Laser diode impulse circuit
- Patent number 4,995,044
- Issue date Feb 19, 1991
- Tektronix, Inc.
- Stephen F. Blazo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical waveguide photocathode
- Patent number 4,868,380
- Issue date Sep 19, 1989
- Tektronix, Inc.
- Richard A. Booman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid crystal light valve with spatially uniform light transmittan...
- Patent number 4,791,339
- Issue date Dec 13, 1988
- Tektronix, Inc.
- Arthur J. Draz
- G02 - OPTICS
Information Patent Grant
Processing circuit for capturing event in digital camera system
- Patent number 4,791,589
- Issue date Dec 13, 1988
- Tektronix, Inc.
- Stephen F. Blazo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for measurement of pulse width of very short p...
- Patent number 4,775,244
- Issue date Oct 4, 1988
- Tektronix, Inc.
- Richard A. Booman
- G04 - HOROLOGY
Information Patent Grant
Digital camera frame capture circuit
- Patent number 4,736,250
- Issue date Apr 5, 1988
- Tektronix, Inc.
- Stephen F. Blazo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charge image charge transfer cathode ray tube having a scan expansi...
- Patent number 4,130,775
- Issue date Dec 19, 1978
- Tektronix, Inc.
- Peter E. Perkins
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Optical Test System Using an Array Laser
- Publication number 20180205198
- Publication date Jul 19, 2018
- Stephen Frank Blazo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tunable laser calibration system
- Publication number 20030132375
- Publication date Jul 17, 2003
- Stephen Frank Blazo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wavelength calibration system using out of band gas cell lines
- Publication number 20030113114
- Publication date Jun 19, 2003
- Stephen Frank Blazo
- G02 - OPTICS
Information Patent Application
Extended range frequency calibration device
- Publication number 20020121592
- Publication date Sep 5, 2002
- Stephen F. Blazo
- G01 - MEASURING TESTING
Information Patent Application
Frequency dithering for DDS spectral purity
- Publication number 20020094053
- Publication date Jul 18, 2002
- Stephen F. Blazo
- G06 - COMPUTING CALCULATING COUNTING

Stephen F. Blazo

Person

Patents Grantslast 30 patents

Frequency dithering for DDS spectral purity

Electrical signal jitter and wander measurement system and method

Phase measurement apparatus and method

Signal generator for generating a jitter/wander output

Laser diode impulse circuit

Optical waveguide photocathode

Liquid crystal light valve with spatially uniform light transmittan...

Processing circuit for capturing event in digital camera system

Method and apparatus for measurement of pulse width of very short p...

Digital camera frame capture circuit

Charge image charge transfer cathode ray tube having a scan expansi...

Patents Applicationslast 30 patents

Optical Test System Using an Array Laser

Tunable laser calibration system

Wavelength calibration system using out of band gas cell lines

Extended range frequency calibration device

Frequency dithering for DDS spectral purity