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Stephen Frank Meier
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for distinguishing spatial and thermal defects on...
Patent number
8,369,038
Issue date
Feb 5, 2013
MRA Tek LLC
Stephen Frank Meier
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and system for distinguishing spatial and thermal defects on...
Patent number
7,929,235
Issue date
Apr 19, 2011
MRA TEK, LLC
Stephen Frank Meier
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Hard disk inspection method and system
Patent number
7,630,154
Issue date
Dec 8, 2009
MRA TEK, LLC
Stephen Frank Meier
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for distinguishing spatial and thermal defects on...
Patent number
7,532,422
Issue date
May 12, 2009
MRA TEK, LLC
Stephen Frank Meier
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for infrared detection of electrical short defects
Patent number
6,714,017
Issue date
Mar 30, 2004
Candescent Technologies Corporation
Marius Enachescu
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Patents Applications
last 30 patents
Information
Patent Application
Method and System for Distinguishing Spatial and Thermal Defects on...
Publication number
20120044594
Publication date
Feb 23, 2012
MRA TEK, LLC
Stephen Frank Meier
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Distinguishing Spatial and Thermal Defects on...
Publication number
20090213712
Publication date
Aug 27, 2009
MRA TEK, LLC
Stephen Frank Meier
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DISTINGUISHING SPATIAL AND THERMAL DEFECTS ON...
Publication number
20080100942
Publication date
May 1, 2008
MRA Tek, LLC
Stephen Frank Meier
G01 - MEASURING TESTING
Information
Patent Application
Hard disk inspection method and system
Publication number
20070229999
Publication date
Oct 4, 2007
MRA Tek, LLC
Stephen Frank Meier
G11 - INFORMATION STORAGE
Information
Patent Application
Method and system for infrared detection of electrical short defects
Publication number
20020093354
Publication date
Jul 18, 2002
Marius Enachescu
G01 - MEASURING TESTING