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Stephen J. Hershkowitz
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Manhattan Beach, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Adaptive correction of radar channel-to-channel time-dependent errors
Patent number
11,835,644
Issue date
Dec 5, 2023
Electromagnetic Systems, Inc.
Brian Michael Lamb
G01 - MEASURING TESTING
Information
Patent Grant
Use of dual processing channels for stationary and moving objects i...
Patent number
11,275,170
Issue date
Mar 15, 2022
Electromagnetic Systems, Inc.
Stephen Jeffrey Hershkowitz
G01 - MEASURING TESTING
Information
Patent Grant
Obstacle position and extent measurement by automotive radar
Patent number
11,067,686
Issue date
Jul 20, 2021
Electromagnetic Systems, Inc.
Stephen Jeffrey Hershkowitz
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive correction of radar channel-to-channel time-dependent errors
Patent number
10,989,793
Issue date
Apr 27, 2021
Electromagnetic Systems, Inc.
Brian Michael Lamb
G01 - MEASURING TESTING
Information
Patent Grant
Forward-looking synthetic aperture radar processing
Patent number
8,305,253
Issue date
Nov 6, 2012
MARK Resources, Inc.
Stephen J. Hershkowitz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Adaptive Correction of Radar Channel-to-Channel Time-Dependent Errors
Publication number
20210215792
Publication date
Jul 15, 2021
Electromagnetic Systems, Inc.
Brian Michael Lamb
G01 - MEASURING TESTING
Information
Patent Application
Use of Dual Processing Channels for Stationary and Moving Objects I...
Publication number
20190310360
Publication date
Oct 10, 2019
Electromagnetic Systems, Inc.
Stephen Jeffrey Hershkowitz
G01 - MEASURING TESTING
Information
Patent Application
Obstacle Position and Extent Measurement By Automotive Radar
Publication number
20190196006
Publication date
Jun 27, 2019
Electromagnetic Systems, Inc.
Stephen Jeffrey Hershkowitz
G01 - MEASURING TESTING
Information
Patent Application
Adaptive Correction of Radar Channel-to-Channel Time-Dependent Errors
Publication number
20190170858
Publication date
Jun 6, 2019
Electromagnetic Systems, Inc.
Brian Michael Lamb
G01 - MEASURING TESTING