Membership
Tour
Register
Log in
Stephen J. Morris
Follow
Person
Shrewsbury, GB
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for locating the centre of a beam profile
Patent number
9,091,633
Issue date
Jul 28, 2015
NIGHTINGALE-EOS LTD
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for compensating for sample misalignment
Patent number
9,041,939
Issue date
May 26, 2015
NIGHTINGALE-EOS LTD
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring the thickness or curvature of thin films
Patent number
8,310,686
Issue date
Nov 13, 2012
Nightingale-EOS Ltd
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for positioning a workpiece
Patent number
8,028,427
Issue date
Oct 4, 2011
Nightingale-EOD Ltd.
Stephen J. Morris
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining modifications to semiconductor optical funct...
Patent number
7,224,461
Issue date
May 29, 2007
Therma-Wave, Inc.
Stephen J. Morris
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR COMPENSATING FOR SAMPLE MISALIGNMENT
Publication number
20130070245
Publication date
Mar 21, 2013
Nightingale-EOS Limited
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR LOCATING THE CENTRE OF A BEAM PROFILE
Publication number
20130063719
Publication date
Mar 14, 2013
NIGHTINGALE-EOS LIMITED
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Application
Method for Measuring the Thickness or Curvature of Thin Films
Publication number
20100171965
Publication date
Jul 8, 2010
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Positioning a Workpiece
Publication number
20100107431
Publication date
May 6, 2010
Stephen Morris
G01 - MEASURING TESTING
Information
Patent Application
Method for determining modifications to semiconductor optical funct...
Publication number
20040252306
Publication date
Dec 16, 2004
Stephen J. Morris
G01 - MEASURING TESTING