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STEPHEN JOSEPH GARNIER
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WAUKESHA, WI, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for correcting uniformity of a magnetic resona...
Patent number
10,718,839
Issue date
Jul 21, 2020
GE Precision Healthcare LLC
Yongchuan Lai
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for using B1 map to correct intensity of magne...
Patent number
10,054,658
Issue date
Aug 21, 2018
General Electric Company
Dawei Gui
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR CORRECTING UNIFORMITY OF A MAGNETIC RESONA...
Publication number
20180120399
Publication date
May 3, 2018
GENERAL ELECTRIC COMPANY
Yongchuan Lai
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR USING B1 MAP TO CORRECT INTENSITY OF MAGNE...
Publication number
20160187438
Publication date
Jun 30, 2016
GENERAL ELECTRIC COMPANY
DAWEI GUI
G01 - MEASURING TESTING