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Stephen Knol
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Die-to-die interface configuration and methods of use thereof
Patent number
10,424,921
Issue date
Sep 24, 2019
QUALCOMM Incorporated
Kenneth Dubowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for wafer-level loopback test
Patent number
10,114,074
Issue date
Oct 30, 2018
QUALCOMM Incorporated
Alvin Leng Sun Loke
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for wafer-level loopback test
Patent number
9,977,078
Issue date
May 22, 2018
QUALCOMM Incorporated
Alvin Leng Sun Loke
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for clock distribution in a die-to-die interface
Patent number
9,654,090
Issue date
May 16, 2017
QUALCOMM Incorporated
Thomas Clark Bryan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Systems and methods for clock distribution in a die-to-die interface
Patent number
9,350,339
Issue date
May 24, 2016
QUALCOMM Incorporated
Thomas Clark Bryan
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for providing data channels at a die-to-die int...
Patent number
9,245,870
Issue date
Jan 26, 2016
QUALCOMM Incorporated
LuVerne Ray Peterson
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
SYSTEMS AND METHODS FOR WAFER-LEVEL LOOPBACK TEST
Publication number
20180231608
Publication date
Aug 16, 2018
QUALCOMM Incorporated
Alvin Leng Sun Loke
G01 - MEASURING TESTING
Information
Patent Application
Die-to-Die Interface Configuration and Methods of Use Thereof
Publication number
20180233907
Publication date
Aug 16, 2018
QUALCOMM Incorporated
Kenneth Dubowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR CLOCK DISTRIBUTION IN A DIE-TO-DIE INTERFACE
Publication number
20160308519
Publication date
Oct 20, 2016
QUALCOMM Incorporated
Thomas Clark Bryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR WAFER-LEVEL LOOPBACK TEST
Publication number
20160025807
Publication date
Jan 28, 2016
QUALCOMM Incorporated
Alvin Leng Sun Loke
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR CLOCK DISTRIBUTION IN A DIE-TO-DIE INTERFACE
Publication number
20160020759
Publication date
Jan 21, 2016
QUALCOMM Incorporated
Thomas Clark Bryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PASSING HIGH VOLTAGE INPUTS USING A CONTROLLED FLOATING PASS GATE
Publication number
20150042401
Publication date
Feb 12, 2015
QUALCOMM Incorporated
Stephen Knol
G05 - CONTROLLING REGULATING