Stephen M. Sparagna

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Milton, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Array and module calibration with delay line
- Patent number 11,187,786
- Issue date Nov 30, 2021
- Raytheon Company
- Debra J. Tonks
- G01 - MEASURING TESTING
Information Patent Grant
Array and module calibration with delay line
- Patent number 10,371,798
- Issue date Aug 6, 2019
- Raytheon Company
- Debra J. Tonks
- G01 - MEASURING TESTING
Information Patent Grant
Sequential multi-beam radar for maximum likelihood tracking and fen...
- Patent number 9,891,310
- Issue date Feb 13, 2018
- Raytheon Company
- Kaichiang Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for rejecting intermodulation products
- Patent number 9,086,476
- Issue date Jul 21, 2015
- Raytheon Company
- Jack J. Schuss
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric resonator filter
- Patent number 4,963,841
- Issue date Oct 16, 1990
- Raytheon Company
- Stephen M. Sparagna
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ARRAY AND MODULE CALIBRATION WITH DELAY LINE
- Publication number 20200049798
- Publication date Feb 13, 2020
- Raytheon Company
- Debra J. Tonks
- G01 - MEASURING TESTING
Information Patent Application
ARRAY AND MODULE CALIBRATION WITH DELAY LINE
- Publication number 20170153317
- Publication date Jun 1, 2017
- Raytheon Company
- Debra J. Tonks
- G01 - MEASURING TESTING
Information Patent Application
SEQUENTIAL MULTI-BEAM RADAR FOR MAXIMUM LIKELIHOOD TRACKING AND FEN...
- Publication number 20160291144
- Publication date Oct 6, 2016
- Raytheon Company
- Kaichiang Chang
- G01 - MEASURING TESTING