Stephen Potvin

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Winooski, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Circuit for detecting and recording chip fails and the method thereof
- Patent number 8,543,870
- Issue date Sep 24, 2013
- Nanya Technology Corporation
- Stephen Potvin
- G01 - MEASURING TESTING
Information Patent Grant
Memory apparatus
- Patent number 8,467,254
- Issue date Jun 18, 2013
- Nanya Technology Corporation
- Jason Varricchione
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY APPARATUS
- Publication number 20130077414
- Publication date Mar 28, 2013
- NANYA TECHNOLOGY CORPORATION
- Jason Varricchione
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT FOR DETECTING AND RECORDING CHIP FAILS AND THE METHOD THEREOF
- Publication number 20120210170
- Publication date Aug 16, 2012
- NANYA TECHNOLOGY CORP
- Stephen POTVIN
- G01 - MEASURING TESTING