Stephen S. Sturges

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Compressed test patterns for a field programmable gate array
- Patent number 11,193,975
- Issue date Dec 7, 2021
- Intel Corportion
- Christopher J. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
High density low cost wideband production RF test instrument archit...
- Patent number 10,469,181
- Issue date Nov 5, 2019
- Intel Corporation
- Jin Pan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Low cost test for IC's or electrical modules using standard reconfi...
- Patent number 7,412,342
- Issue date Aug 12, 2008
- Intel Corporation
- Stephen S. Sturges
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive, low cost method and apparatus for the transmission, d...
- Patent number 7,319,404
- Issue date Jan 15, 2008
- Intel Corporation
- Stephen S. Sturges
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPRESSED TEST PATTERNS FOR A FIELD PROGRAMMABLE GATE ARRAY
- Publication number 20200003836
- Publication date Jan 2, 2020
- Intel Corporation
- Christopher J. NELSON
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY LOW COST WIDEBAND PRODUCTION RF TEST INSTRUMENT ARCHIT...
- Publication number 20180351662
- Publication date Dec 6, 2018
- Jin Pan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Low cost test for IC's or electrical modules using standard reconfi...
- Publication number 20060100812
- Publication date May 11, 2006
- Stephen S. Sturges
- G01 - MEASURING TESTING
Information Patent Application
Non-invasive, low cost method and apparatus for the transmission, d...
- Publication number 20060016384
- Publication date Jan 26, 2006
- Stephen S. Sturges
- G06 - COMPUTING CALCULATING COUNTING