Stephen Thung

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Norman, OK, US

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Patents Grantslast 30 patents

Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Specification to Test using Generative Artificial Intelligence
- Publication number 20250053500
- Publication date Feb 13, 2025
- National Instruments Corporation
- Alejandro Barreto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF ADAPTIVELY ASSIGNING SCENARIO-BASED TESTS TO T...
- Publication number 20240160542
- Publication date May 16, 2024
- National Instruments Corporation
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARAMETER SPACE REDUCTION FOR DEVICE TESTING
- Publication number 20230114555
- Publication date Apr 13, 2023
- National Instruments Corporation
- James C. Nagle
- G01 - MEASURING TESTING