Steve Buchholz

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Photomask inspection apparatus and method with improved defect dete...
- Patent number 4,579,455
- Issue date Apr 1, 1986
- KLA Instruments Corporation
- Kenneth Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic system and method for inspecting hole quality
- Patent number 4,555,798
- Issue date Nov 26, 1985
- KLA Instruments Corporation
- William H. Broadbent
- G06 - COMPUTING CALCULATING COUNTING