Steve Cooper

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Hayes, GB

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Patents Grantslast 30 patents

Information Patent Grant
In-circuit test using scan chains
- Patent number 6,700,581
- Issue date Mar 2, 2004
- 3D Labs Inc., Ltd.
- David Robert Baldwin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
In-circuit test using scan chains
- Publication number 20030164825
- Publication date Sep 4, 2003
- 3Dlabs Inc., Ltd.
- David Robert Baldwin
- G06 - COMPUTING CALCULATING COUNTING