Steve Cui

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Laser closed power loop with an acousto-optic modulator for power m...
- Patent number 11,374,375
- Issue date Jun 28, 2022
- KLA Corporation
- Mandar Paranjape
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for advanced defect ablation protection
- Patent number 11,181,484
- Issue date Nov 23, 2021
- KLA Corporation
- Zhiwei Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface defect inspection with large particle monitoring and laser...
- Patent number 10,324,045
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Steve (Yifeng) Cui
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,645,093
- Issue date May 9, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,176,069
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Focusing detector of an interferometry system
- Patent number 8,902,429
- Issue date Dec 2, 2014
- KLA-Tencor Corporation
- Jie-Fei Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for improving the temperature stability and mi...
- Patent number 8,621,945
- Issue date Jan 7, 2014
- KLA Tencor
- An Andrew Zeng
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods for inspecting an edge of a specimen
- Patent number 7,728,965
- Issue date Jun 1, 2010
- KLA-Tencor Technologies Corp.
- Kurt Lindsay Haller
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact methods for measuring electrical thickness and determin...
- Patent number 7,103,484
- Issue date Sep 5, 2006
- KLA-Tencor Technologies Corp.
- Jianou Shi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser Closed Power Loop with an Acousto-Optic Modulator for Power M...
- Publication number 20210050700
- Publication date Feb 18, 2021
- KLA Corporation
- Mandar Paranjape
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Defect Inspection With Large Particle Monitoring And Laser...
- Publication number 20180038803
- Publication date Feb 8, 2018
- KLA-Tencor Corporation
- Steve (Yifeng) Cui
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20160054232
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
REDUCING REGISTRATION ERROR OF FRONT AND BACK WAFER SURFACES UTILIZ...
- Publication number 20150192404
- Publication date Jul 9, 2015
- KLA-Tencor Corporation
- Shouhong Tang
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20140016125
- Publication date Jan 16, 2014
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
METHOD AND APPAATUS FOR IMPROVING THE TEMPERATURE STABILITY AND MIN...
- Publication number 20120118061
- Publication date May 17, 2012
- KLA-Tencor Corporation
- An Andrew Zeng
- G05 - CONTROLLING REGULATING
Information Patent Application
Systems and methods for inspecting an edge of a specimen
- Publication number 20060274304
- Publication date Dec 7, 2006
- Kurt Lindsay Haller
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Laser closed power loop with an acousto-optic modulator for power m...

Systems and methods for advanced defect ablation protection

Surface defect inspection with large particle monitoring and laser...

System and method for apodization in a semiconductor device inspect...

System and method for apodization in a semiconductor device inspect...

Focusing detector of an interferometry system

Method and apparatus for improving the temperature stability and mi...

Systems and methods for inspecting an edge of a specimen

Non-contact methods for measuring electrical thickness and determin...

Patents Applicationslast 30 patents

Laser Closed Power Loop with an Acousto-Optic Modulator for Power M...

Surface Defect Inspection With Large Particle Monitoring And Laser...

System and Method for Apodization in a Semiconductor Device Inspect...

REDUCING REGISTRATION ERROR OF FRONT AND BACK WAFER SURFACES UTILIZ...

System and Method for Apodization in a Semiconductor Device Inspect...

METHOD AND APPAATUS FOR IMPROVING THE TEMPERATURE STABILITY AND MIN...

Systems and methods for inspecting an edge of a specimen