Steve Hummel

Person

Bend, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature-controlled solar power inverters
- Patent number 8,676,398
- Issue date Mar 18, 2014
- John M. Fife
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method of determining maximum power point tracking for a...
- Patent number 8,344,547
- Issue date Jan 1, 2013
- Advanced Energy Industries, Inc.
- John M. Fife
- G05 - CONTROLLING REGULATING
Information Patent Grant
Solar inverter cabinet architecture
- Patent number 8,233,278
- Issue date Jul 31, 2012
- Advanced Energy Industries, Inc.
- Brian J. Hoffman
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for evaluating microstructures on a workpiece based on the o...
- Patent number 8,027,037
- Issue date Sep 27, 2011
- Nanometrics Incorporated
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Grant
System and method of determining maximum power point tracking for a...
- Patent number 7,960,863
- Issue date Jun 14, 2011
- PV Powered, Inc.
- John M. Fife
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for evaluating microstructures on a workpiece based on the o...
- Patent number 7,656,542
- Issue date Feb 2, 2010
- Nanometrics Incorporated
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for enhanced critical dimension scatterometry
- Patent number 7,615,752
- Issue date Nov 10, 2009
- Nanometrics Incorporated
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometer having a computer system that reads data from selecte...
- Patent number 7,511,293
- Issue date Mar 31, 2009
- Nanometrics Incorporated
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Grant
Photoluminescence imaging with preferential detection of photolumin...
- Patent number 7,504,642
- Issue date Mar 17, 2009
- Nanometrics Incorporated
- Steven G. Hummel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for enhanced critical dimension scatterometry
- Patent number 7,502,101
- Issue date Mar 10, 2009
- Nanometrics Incorporated
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Grant
Differential wavelength photoluminescence for non-contact measuring...
- Patent number 7,446,321
- Issue date Nov 4, 2008
- Nanometrics Incorporated
- Nicolas Laurent
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF DETERMINING MAXIMUM POWER POINT TRACKING FOR A...
- Publication number 20110282502
- Publication date Nov 17, 2011
- John M. Fife
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR FORECASTING SOLAR POWER
- Publication number 20110282514
- Publication date Nov 17, 2011
- Michael Ropp
- F24 - HEATING RANGES VENTILATING
Information Patent Application
SYSTEMS AND METHODS FOR FORECASTING SOLAR POWER
- Publication number 20110276269
- Publication date Nov 10, 2011
- Steven G. Hummel
- F24 - HEATING RANGES VENTILATING
Information Patent Application
SOLAR POWER INVERTERS, INCLUDING TEMPERATURE-CONTROLLED SOLAR POWER...
- Publication number 20100134959
- Publication date Jun 3, 2010
- John M. Fife
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for Evaluating Microstructures on a Workpiece Based on the O...
- Publication number 20100135571
- Publication date Jun 3, 2010
- Nanometrics Incorporated
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF DETERMINING MAXIMUM POWER POINT TRACKING FOR A...
- Publication number 20100117623
- Publication date May 13, 2010
- John M. Fife
- G05 - CONTROLLING REGULATING
Information Patent Application
SOLAR INVERTER CABINET ARCHITECTURE
- Publication number 20100118488
- Publication date May 13, 2010
- Brian J. Hoffman
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for evaluating microstructures on a workpiece based on the o...
- Publication number 20070211261
- Publication date Sep 13, 2007
- Mike Littau
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and methods for analyzing semiconductor workpieces
- Publication number 20070176119
- Publication date Aug 2, 2007
- Accent Optical Technologies, Inc.
- Steve Hummel
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING...
- Publication number 20070007466
- Publication date Jan 11, 2007
- Nicolas LAURENT
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENCE IMAGING WITH PREFERENTIAL DETECTION OF PHOTOLUMIN...
- Publication number 20070008518
- Publication date Jan 11, 2007
- Steven G. Hummel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289788
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289789
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289790
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060285110
- Publication date Dec 21, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060278834
- Publication date Dec 14, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060273263
- Publication date Dec 7, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060243912
- Publication date Nov 2, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES
- Publication number 20060244969
- Publication date Nov 2, 2006
- Tom W. Ryan
- G01 - MEASURING TESTING

Steve Hummel

Person

Patents Grantslast 30 patents

Temperature-controlled solar power inverters

System and method of determining maximum power point tracking for a...

Solar inverter cabinet architecture

Method for evaluating microstructures on a workpiece based on the o...

System and method of determining maximum power point tracking for a...

Method for evaluating microstructures on a workpiece based on the o...

Apparatus and method for enhanced critical dimension scatterometry

Scatterometer having a computer system that reads data from selecte...

Photoluminescence imaging with preferential detection of photolumin...

Apparatus and method for enhanced critical dimension scatterometry

Differential wavelength photoluminescence for non-contact measuring...

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF DETERMINING MAXIMUM POWER POINT TRACKING FOR A...

SYSTEMS AND METHODS FOR FORECASTING SOLAR POWER

SYSTEMS AND METHODS FOR FORECASTING SOLAR POWER

SOLAR POWER INVERTERS, INCLUDING TEMPERATURE-CONTROLLED SOLAR POWER...

Method for Evaluating Microstructures on a Workpiece Based on the O...

SYSTEM AND METHOD OF DETERMINING MAXIMUM POWER POINT TRACKING FOR A...

SOLAR INVERTER CABINET ARCHITECTURE

Method for evaluating microstructures on a workpiece based on the o...

Apparatuses and methods for analyzing semiconductor workpieces

DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING...

PHOTOLUMINESCENCE IMAGING WITH PREFERENTIAL DETECTION OF PHOTOLUMIN...

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

Apparatus and method for enhanced critical dimension scatterometry

APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES