Membership
Tour
Register
Log in
Steve K. Sullivan
Follow
Person
Beaverton, OR, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
High waveform throughput with a large acquisition memory
Patent number
8,374,811
Issue date
Feb 12, 2013
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Fast rasterizer
Patent number
8,059,129
Issue date
Nov 15, 2011
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Test and measurement instrument and method for providing post-acqui...
Patent number
8,024,141
Issue date
Sep 20, 2011
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Grant
Drawing waveforms in no dead time acquisition system
Patent number
7,855,547
Issue date
Dec 21, 2010
Tektronix, Inc.
Kenneth P. Dobyns
G01 - MEASURING TESTING
Information
Patent Grant
Waveform compression and display
Patent number
7,834,780
Issue date
Nov 16, 2010
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Multiple probe acquisition system
Patent number
7,795,860
Issue date
Sep 14, 2010
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Self-adjusting hold-off trigger
Patent number
7,723,976
Issue date
May 25, 2010
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
No dead time data acquisition
Patent number
7,652,465
Issue date
Jan 26, 2010
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Data management in long record length memory
Patent number
7,558,936
Issue date
Jul 7, 2009
Tektronix, Inc.
Terrance R. Beale
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Mixed signal display for a measurement instrument
Patent number
7,529,641
Issue date
May 5, 2009
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Logic analyzer using a digital filter
Patent number
7,526,395
Issue date
Apr 28, 2009
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Compressed logic sample storage
Patent number
7,366,628
Issue date
Apr 29, 2008
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Digital trigger
Patent number
7,352,167
Issue date
Apr 1, 2008
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
DDS pulse generator architecture
Patent number
7,284,025
Issue date
Oct 16, 2007
Tektronix, Inc.
Steven K. Sullivan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Triggered DDS pulse generator architecture
Patent number
7,281,025
Issue date
Oct 9, 2007
Tektronix, Inc.
Steven K. Sullivan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for an improved timer circuit and pulse width...
Patent number
7,068,087
Issue date
Jun 27, 2006
Tektronix, Inc.
John F. Stoops
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method and apparatus for signal analysis device
Patent number
6,801,042
Issue date
Oct 5, 2004
Tektronix, Inc.
Mark E. Mc Pherson
G01 - MEASURING TESTING
Information
Patent Grant
Continually responsive and anticipating automatic setup function fo...
Patent number
6,571,185
Issue date
May 27, 2003
Tektronix, Inc.
Michael A. Gauland
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function digital persistence decay
Patent number
6,333,732
Issue date
Dec 25, 2001
Tektronix, Inc.
Paul M. Gerlach
G01 - MEASURING TESTING
Information
Patent Grant
Reacting to unusual waveforms
Patent number
6,188,384
Issue date
Feb 13, 2001
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Detection of unusual waveforms
Patent number
6,163,758
Issue date
Dec 19, 2000
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Sparse vector rasterization
Patent number
6,104,374
Issue date
Aug 15, 2000
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
High speed analog signal sampling system
Patent number
5,521,599
Issue date
May 28, 1996
Tektronix, Inc.
Benjamin J. McCarroll
G11 - INFORMATION STORAGE
Information
Patent Grant
Reduced input capacitance analog storage array
Patent number
5,406,507
Issue date
Apr 11, 1995
Tektronix, Inc.
Daniel G. Knierim
G11 - INFORMATION STORAGE
Information
Patent Grant
Peak detection circuit
Patent number
5,324,994
Issue date
Jun 28, 1994
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Analog acquisition system including a high speed timing generator
Patent number
5,144,525
Issue date
Sep 1, 1992
Tektronix, Inc.
Charles L. Saxe
G11 - INFORMATION STORAGE
Information
Patent Grant
Digital integrated circuit propagation delay regulator
Patent number
4,980,586
Issue date
Dec 25, 1990
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Calibrated automatic test system
Patent number
4,724,378
Issue date
Feb 9, 1988
Tektronix, Inc.
Donald F. Murray
G01 - MEASURING TESTING
Information
Patent Grant
Active load network
Patent number
4,712,058
Issue date
Dec 8, 1987
Tektronix, Inc.
Christopher W. Branson
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable impedance driver network
Patent number
4,707,620
Issue date
Nov 17, 1987
Tektronix, Inc.
Steven K. Sullivan
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
TRIGGER DISPLAY
Publication number
20140055480
Publication date
Feb 27, 2014
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
TEST AND MEASUREMENT INSTRUMENT AND METHOD FOR PROVIDING POST-ACQUI...
Publication number
20130245977
Publication date
Sep 19, 2013
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
High Waveform Throughput with a Large Acquisition Memory
Publication number
20110137594
Publication date
Jun 9, 2011
Tektronix, Inc.
Steven K. SULLIVAN
G01 - MEASURING TESTING
Information
Patent Application
Test and Measurement Instrument and Method For Providing Post-Acqui...
Publication number
20110060540
Publication date
Mar 10, 2011
Tektronix, Inc.
Josiah A. BARTLETT
G01 - MEASURING TESTING
Information
Patent Application
Test and Measurement Instrument and Method For Providing Post-Acqui...
Publication number
20110060541
Publication date
Mar 10, 2011
Tektronix, Inc.
Josiah A. BARTLETT
G01 - MEASURING TESTING
Information
Patent Application
DRAWING WAVEFORMS IN NO DEAD TIME ACQUISITION SYSTEM
Publication number
20090261814
Publication date
Oct 22, 2009
Tektronix, Inc.
Kenneth P. DOBYNS
G01 - MEASURING TESTING
Information
Patent Application
LOGIC ANALYZER USING A DIGITAL FILTER
Publication number
20090063072
Publication date
Mar 5, 2009
Tektronix, Inc.
Steven K. SULLIVAN
G01 - MEASURING TESTING
Information
Patent Application
Multiple probe acquisition system
Publication number
20080042666
Publication date
Feb 21, 2008
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
SELF-ADJUSTING HOLD-OFF TRIGGER
Publication number
20080030239
Publication date
Feb 7, 2008
Tektronix, Inc.
Steven K. SULLIVAN
G01 - MEASURING TESTING
Information
Patent Application
Mixed signal display for a measurement instrument
Publication number
20070250278
Publication date
Oct 25, 2007
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Fast rasterizer
Publication number
20070236480
Publication date
Oct 11, 2007
Steven K. Sullivan
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Data management in long record length memory
Publication number
20070226406
Publication date
Sep 27, 2007
Terrance R. Beale
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
No dead time data acquisition
Publication number
20070222429
Publication date
Sep 27, 2007
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Digital trigger
Publication number
20070222430
Publication date
Sep 27, 2007
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Waveform compression and display
Publication number
20070217694
Publication date
Sep 20, 2007
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Compressed logic sample storage
Publication number
20070100568
Publication date
May 3, 2007
Steven K. Sullivan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND APPARATUS FOR AN IMPROVED TIMER CIRCUIT AND PULSE WIDTH...
Publication number
20050184777
Publication date
Aug 25, 2005
John F. Stoops
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Alias detection when displaying FFTS
Publication number
20050165568
Publication date
Jul 28, 2005
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Triggered DDS pulse generator architecture
Publication number
20050138094
Publication date
Jun 23, 2005
Steven K. Sullivan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DDS pulse generator architecture
Publication number
20050134330
Publication date
Jun 23, 2005
Steven K. Sullivan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Calibration method and apparatus for signal analysis device
Publication number
20030112017
Publication date
Jun 19, 2003
Mark E. Mc Pherson
G01 - MEASURING TESTING