TREA

Steve Leo Dingle

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  • Jericho, VT, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor wafer test and burn-in
    • Patent number 6,351,134
    • Issue date Feb 26, 2002
    • International Business Machines Corporation
    • James Marc Leas
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor wafer test and burn-in
    • Patent number 5,929,651
    • Issue date Jul 27, 1999
    • International Business Machines Corporation
    • James Marc Leas
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents