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Steve Leo Dingle
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Jericho, VT, US
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor wafer test and burn-in
Patent number
6,351,134
Issue date
Feb 26, 2002
International Business Machines Corporation
James Marc Leas
G01 - MEASURING TESTING
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Patent Grant
Semiconductor wafer test and burn-in
Patent number
5,929,651
Issue date
Jul 27, 1999
International Business Machines Corporation
James Marc Leas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR WAFER TEST AND BURN-IN
Publication number
20020003432
Publication date
Jan 10, 2002
JAMES MARC LEAS
G01 - MEASURING TESTING