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Steve Munroe
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Lakeway, TX, US
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last 30 patents
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Patent Grant
Jitter measurement algorithm using locally in-order strobes
Patent number
7,668,235
Issue date
Feb 23, 2010
Teradyne
Michael Panis
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Jitter measurement algorithm using locally in-order strobes
Publication number
20070118315
Publication date
May 24, 2007
Teradyne, Inc.
Michael Panis
G01 - MEASURING TESTING