Steve Poirier

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Lafayette, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated standards sampling
- Patent number 8,003,048
- Issue date Aug 23, 2011
- GE Analytical Instruments
- Brian K. Clay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automated Standards Sampling
- Publication number 20100279417
- Publication date Nov 4, 2010
- Brian K. Clay
- G01 - MEASURING TESTING