Steve Rott

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St. Cloud, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,928,423
- Issue date Feb 23, 2021
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,067,164
- Issue date Sep 4, 2018
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit and wafer level IC te...
- Patent number 9,696,347
- Issue date Jul 4, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20190004093
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20170059616
- Publication date Mar 2, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...
- Publication number 20150015287
- Publication date Jan 15, 2015
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING