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Steve Scranton
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San Martin, CA, US
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last 30 patents
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Patent Grant
Systems, devices, and methods for combined wafer and photomask insp...
Patent number
11,125,677
Issue date
Sep 21, 2021
Nanotronics Imaging, Inc.
Randolph E. Griffith
G01 - MEASURING TESTING
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Patent Grant
Systems, devices, and methods for combined wafer and photomask insp...
Patent number
10,254,214
Issue date
Apr 9, 2019
Nanotronics Imaging, Inc.
Randolph E. Griffith
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEMS, DEVICES, AND METHODS FOR COMBINED WAFER AND PHOTOMASK INSP...
Publication number
20190257741
Publication date
Aug 22, 2019
Nanotronics Imaging, Inc.
Randolph E. Griffith
G01 - MEASURING TESTING