Steve Slonaker

Person

San Mateo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High-resolution position encoder with image sensor and encoded targ...
- Patent number 11,061,338
- Issue date Jul 13, 2021
- NIKON CORPORATION
- Jonathan Kyle Wells
- G01 - MEASURING TESTING
Information Patent Grant
Spatial-frequency matched wafer alignment marks, wafer alignment an...
- Patent number 10,871,708
- Issue date Dec 22, 2020
- Nikon Corporation
- Steven Douglas Slonaker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Programmable imaging assembly for manufacturing biotest post arrays
- Patent number 9,639,003
- Issue date May 2, 2017
- Nikon Corporation
- Steven Douglas Slonaker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for an adjusting optical proximity effect for an...
- Patent number 8,300,214
- Issue date Oct 30, 2012
- Nikon Precision Inc.
- Stephen P. Renwick
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for reconstructing aberrated image profiles throu...
- Patent number 8,027,813
- Issue date Sep 27, 2011
- Nikon Precision, Inc.
- Steven Douglas Slonaker
- G02 - OPTICS
Information Patent Grant
Method to diagnose imperfections in illuminator of a lithographic tool
- Patent number 6,943,882
- Issue date Sep 13, 2005
- Nikon Precision, Inc.
- Stephen P. Renwick
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for position measurement of a pattern formed b...
- Patent number 6,664,121
- Issue date Dec 16, 2003
- Nikon Precision, Inc.
- Ilya Grodnensky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for dimension measurement of a pattern formed...
- Patent number 6,538,753
- Issue date Mar 25, 2003
- Nikon Precision, Inc.
- Ilya Grodnensky
- G01 - MEASURING TESTING
Information Patent Grant
Field curvature correction utilizing smoothly curved chuck for subs...
- Patent number 6,025,099
- Issue date Feb 15, 2000
- Steven Douglas Slonaker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
E-BEAM POSITION TRACKER
- Publication number 20220293390
- Publication date Sep 15, 2022
- Nikon Corporation
- Jacek Kazimierz Tyminski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-RESOLUTION POSITION ENCODER WITH IMAGE SENSOR AND ENCODED TARG...
- Publication number 20180217510
- Publication date Aug 2, 2018
- Nikon Corporation
- J. Kyle Wells
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SPATIAL-FREQUENCY MATCHED WAFER ALIGNMENT MARKS, WAFER ALIGNMENT AN...
- Publication number 20180210332
- Publication date Jul 26, 2018
- Nikon Corporation
- Steven Douglas Slonaker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTISPECTRAL EYEWEAR DEVICE
- Publication number 20170289465
- Publication date Oct 5, 2017
- Nikon Research Corporation of America
- Steven Douglas Slonaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMABLE IMAGING ASSEMBLY FOR MANUFACTURING BIOTEST POST ARRAYS
- Publication number 20150116682
- Publication date Apr 30, 2015
- Nikon Corporation
- Steven Douglas Slonaker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR AN ADJUSTING OPTICAL PROXIMITY EFFECT FOR AN...
- Publication number 20130044308
- Publication date Feb 21, 2013
- Nikon Precision Inc.
- Stephen P. Renwick
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR AN ADJUSTING OPTICAL PROXIMITY EFFECT FOR AN...
- Publication number 20090213349
- Publication date Aug 27, 2009
- Nikon Corporation
- Stephen P. Renwick
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for reconstructing aberrated image profiles throu...
- Publication number 20060066841
- Publication date Mar 30, 2006
- Nikon Precision, Inc.
- Steven Douglas Slonaker
- G02 - OPTICS
Information Patent Application
Method to diagnose imperfections in illuminator of a lithographic tool
- Publication number 20040119957
- Publication date Jun 24, 2004
- Stephen P. Renwick
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR POSITION MEASUREMENT OF A PATTERN FORMED B...
- Publication number 20030215965
- Publication date Nov 20, 2003
- Ilya Grodnensky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for dimension measurement of a pattern formed...
- Publication number 20020180990
- Publication date Dec 5, 2002
- Ilya Grodnensky
- G01 - MEASURING TESTING

Steve Slonaker

Person

Patents Grantslast 30 patents

High-resolution position encoder with image sensor and encoded targ...

Spatial-frequency matched wafer alignment marks, wafer alignment an...

Programmable imaging assembly for manufacturing biotest post arrays

System and method for an adjusting optical proximity effect for an...

Method and system for reconstructing aberrated image profiles throu...

Method to diagnose imperfections in illuminator of a lithographic tool

Method and apparatus for position measurement of a pattern formed b...

Method and apparatus for dimension measurement of a pattern formed...

Field curvature correction utilizing smoothly curved chuck for subs...

Patents Applicationslast 30 patents

E-BEAM POSITION TRACKER

HIGH-RESOLUTION POSITION ENCODER WITH IMAGE SENSOR AND ENCODED TARG...

SPATIAL-FREQUENCY MATCHED WAFER ALIGNMENT MARKS, WAFER ALIGNMENT AN...

MULTISPECTRAL EYEWEAR DEVICE

PROGRAMMABLE IMAGING ASSEMBLY FOR MANUFACTURING BIOTEST POST ARRAYS

SYSTEM AND METHOD FOR AN ADJUSTING OPTICAL PROXIMITY EFFECT FOR AN...

SYSTEM AND METHOD FOR AN ADJUSTING OPTICAL PROXIMITY EFFECT FOR AN...

Method and system for reconstructing aberrated image profiles throu...

Method to diagnose imperfections in illuminator of a lithographic tool

METHOD AND APPARATUS FOR POSITION MEASUREMENT OF A PATTERN FORMED B...

Method and apparatus for dimension measurement of a pattern formed...