Steve Timm

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Bellevue, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current probe
- Patent number 11,499,941
- Issue date Nov 15, 2022
- Zetec, Inc.
- Steve Timm
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current inspection probe based on magnetoresistive sensors
- Patent number 9,784,715
- Issue date Oct 10, 2017
- Zetec, Inc.
- Jevne Branden Micheau-Cunningham
- G01 - MEASURING TESTING
Information Patent Grant
Axial and circumferential flaw sensing eddy current probe
- Patent number 9,267,921
- Issue date Feb 23, 2016
- Zetec, Inc.
- Jevne Branden Michaeu-Cunningham
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 5,279,168
- Issue date Jan 18, 1994
- Stephen D. Timm
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REPLACEABLE ONE-PIECE CENTERING ASSEMBLY FOR EDDY CURRENT PROBE
- Publication number 20250027906
- Publication date Jan 23, 2025
- Zetec, Inc.
- William Frederick Ziegenhagen
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE CENTERING FEET ASSEMBLY FOR EDDY CURRENT PROBE
- Publication number 20240053298
- Publication date Feb 15, 2024
- Zetec, Inc.
- William Frederick Ziegenhagen
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT PROBE
- Publication number 20200191748
- Publication date Jun 18, 2020
- Zetec, Inc.
- Steve Timm
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT INSPECTION PROBE BASED ON MAGNETORESISTIVE SENSORS
- Publication number 20160084800
- Publication date Mar 24, 2016
- Jevne Branden MICHAEU-CUNNINGHAM
- G01 - MEASURING TESTING
Information Patent Application
Eddy Current Inspection Probe Based on Magnetoresistive Sensors
- Publication number 20140312891
- Publication date Oct 23, 2014
- Zetec, Inc.
- Jevne Branden Micheau-Cunningham
- G01 - MEASURING TESTING
Information Patent Application
AXIAL AND CIRCUMFERENTIAL FLAW SENSING EDDY CURRENT PROBE
- Publication number 20140002070
- Publication date Jan 2, 2014
- Zetec, Inc.
- Jevne Branden Michaeu-Cunningham
- G01 - MEASURING TESTING