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Steve Zamek
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Multi-spot analysis system with multiple optical probes
Patent number
11,441,893
Issue date
Sep 13, 2022
KLA Corporation
Prasanna Dighe
G02 - OPTICS
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Patent Grant
Apparatus for high-speed imaging sensor data transfer
Patent number
10,429,321
Issue date
Oct 1, 2019
KLA-Tencor Corporation
Steve Zamek
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR
Publication number
20220397536
Publication date
Dec 15, 2022
KLA Corporation
Steve Zamek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-Spot Analysis System with Multiple Optical Probes
Publication number
20190331592
Publication date
Oct 31, 2019
KLA-Tencor Corporation
Prasanna Dighe
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for High-Speed Imaging Sensor Data Transfer
Publication number
20180059033
Publication date
Mar 1, 2018
KLA-Tencor Corporation
Steve Zamek
G01 - MEASURING TESTING