Steven A. Henck

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fluorinated coating for an optical element
- Patent number 6,624,944
- Issue date Sep 23, 2003
- Texas Instruments Incorporated
- Robert M. Wallace
- G02 - OPTICS
Information Patent Grant
Low temperature process for post-etch defluoridation of metals
- Patent number 6,140,243
- Issue date Oct 31, 2000
- Texas Instruments Incorporated
- Robert M. Wallace
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro mechanical device with memory metal component
- Patent number 6,072,617
- Issue date Jun 6, 2000
- Texas Instruments Incorporated
- Steven A. Henck
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Method for rapidly etching material on a semiconductor device
- Patent number 5,620,556
- Issue date Apr 15, 1997
- Texas Instruments Incorporated
- Steven A. Henck
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical device manufactured out of incompatible materials
- Patent number 5,604,625
- Issue date Feb 18, 1997
- Texas Instruments Incorporated
- Steven A. Henck
- G02 - OPTICS
Information Patent Grant
Use of incompatible materials to eliminate sticking of micro-mechan...
- Patent number 5,576,878
- Issue date Nov 19, 1996
- Texas Instruments Incorporated
- Steven A. Henck
- G02 - OPTICS
Information Patent Grant
PFPE coatings for micro-mechanical devices
- Patent number 5,512,374
- Issue date Apr 30, 1996
- Texas Instruments Incorporated
- Robert M. Wallace
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and apparatus for process endpoint prediction based on actua...
- Patent number 5,503,707
- Issue date Apr 2, 1996
- Texas Instruments Incorporated
- Sonny Maung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Temperature sensor and method
- Patent number 5,501,637
- Issue date Mar 26, 1996
- Texas Instruments Incorporated
- Walter M. Duncan
- G01 - MEASURING TESTING
Information Patent Grant
Method for rapidly etching material on a semiconductor device
- Patent number 5,425,839
- Issue date Jun 20, 1995
- Texas Instruments Incorporated
- Steven A. Henck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric temperature measurement system and method
- Patent number 5,249,865
- Issue date Oct 5, 1993
- Texas Instruments Incorporated
- Ajit P. Paranjpe
- G01 - MEASURING TESTING

Steven A. Henck

Person

Patents Grantslast 30 patents

Fluorinated coating for an optical element

Low temperature process for post-etch defluoridation of metals

Micro mechanical device with memory metal component

Method for rapidly etching material on a semiconductor device

Micromechanical device manufactured out of incompatible materials

Use of incompatible materials to eliminate sticking of micro-mechan...

PFPE coatings for micro-mechanical devices

Method and apparatus for process endpoint prediction based on actua...

Temperature sensor and method

Method for rapidly etching material on a semiconductor device

Interferometric temperature measurement system and method