Steven B. Herschbein

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inline low-damage automated failure analysis
- Patent number 8,111,903
- Issue date Feb 7, 2012
- International Business Machines Corporation
- Steven B. Herschbein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of accessing semiconductor circuits from the backside using...
- Patent number 7,867,910
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Carmelo F. Scrudato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ high-resolution light-optical channel for optical viewing a...
- Patent number 7,781,733
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution optical channel for non-destructive navigation and...
- Patent number 7,351,966
- Issue date Apr 1, 2008
- International Business Machines Corporation
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector for ion beam applications
- Patent number 7,119,333
- Issue date Oct 10, 2006
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor copper line cutting method
- Patent number 6,987,067
- Issue date Jan 17, 2006
- International Business Machines Corporation
- Lawrence Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample mount for performing sputter-deposition in a focused ion bea...
- Patent number 6,946,064
- Issue date Sep 20, 2005
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dry etch process to edit copper lines
- Patent number 6,900,137
- Issue date May 31, 2005
- International Business Machines Corporation
- Steven B. Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for electrically characterizing charge sensitive semiconduct...
- Patent number 6,858,530
- Issue date Feb 22, 2005
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Grant
Metal dry etch using electronic field
- Patent number 6,843,893
- Issue date Jan 18, 2005
- International Business Machines Corporation
- Steven B. Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Focused ion beam process for removal of copper
- Patent number 6,730,237
- Issue date May 4, 2004
- International Business Machines Corporation
- Michael R. Sievers
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Structure and method for charge sensitive electrical devices
- Patent number 6,670,717
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING
- Publication number 20140073114
- Publication date Mar 13, 2014
- GLOBALFOUNDRIES INC.
- Cheng Cen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING
- Publication number 20130200501
- Publication date Aug 8, 2013
- GLOBALFOUNDRIES INC.
- Cheng Cen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLINE LOW-DAMAGE AUTOMATED FAILURE ANALYSIS
- Publication number 20100080446
- Publication date Apr 1, 2010
- International Business Machines Corporation
- Steven B. Herschbein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ACCESSING SEMICONDUCTOR CIRCUITS FROM THE BACKSIDE USING...
- Publication number 20090302431
- Publication date Dec 10, 2009
- International Business Machines Corporation
- Carmelo F. Scrudato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING A...
- Publication number 20080283777
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-RESOLUTION OPTICAL CHANNEL FOR NON-DESTRUCTIVE NAVIGATION AND...
- Publication number 20080067369
- Publication date Mar 20, 2008
- International Business Machines Corporation
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED ION DETECTOR FOR IONBEAM APPLICATIONS
- Publication number 20060097159
- Publication date May 11, 2006
- International Business Machines Corporation
- Steven B. Herschbein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MANIPULATING SAMPLE TEMPERATURE FOR FOCUSE...
- Publication number 20060065853
- Publication date Mar 30, 2006
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF ALTERING A VERY SMALL SURFACE AREA BY MULTIPLE...
- Publication number 20050016952
- Publication date Jan 27, 2005
- International Business Machines Corporation
- Hendrik F. Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODS OF ALTERING A VERY SMALL SURFACE AREA
- Publication number 20050016954
- Publication date Jan 27, 2005
- International Business Machines Corporation
- Hendrik F. Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE MOUNT FOR PERFORMING SPUTTER-DEPOSITION IN A FOCUSED ION BEA...
- Publication number 20050006231
- Publication date Jan 13, 2005
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DRY ETCH PROCESS TO EDIT COPPER LINES
- Publication number 20040188380
- Publication date Sep 30, 2004
- International Business Machines Corporation
- Steven B. Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Dry etch process for copper
- Publication number 20040132287
- Publication date Jul 8, 2004
- International Business Machines Corporation
- Lawrence S. Fischer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Metal dry etch using electronic field
- Publication number 20040112857
- Publication date Jun 17, 2004
- International Business Machines Corporation
- Steven B. Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Structure and method for charge sensitive electrical devices
- Publication number 20040089952
- Publication date May 13, 2004
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Application
Tool having a plurality of electrodes and corresponding method of a...
- Publication number 20040060904
- Publication date Apr 1, 2004
- International Business Machines Corporation
- Steven Brett Herschbein
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor copper line cutting method
- Publication number 20040038433
- Publication date Feb 26, 2004
- International Business Machines Corporation
- Lawrence Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and method for charge sensitive electrical devices
- Publication number 20030071361
- Publication date Apr 17, 2003
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam process for removal of copper
- Publication number 20020195422
- Publication date Dec 26, 2002
- International Business Machines Corporation
- Michael R. Sievers
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Steven B. Herschbein

Person

Patents Grantslast 30 patents

Inline low-damage automated failure analysis

Method of accessing semiconductor circuits from the backside using...

In-situ high-resolution light-optical channel for optical viewing a...

High-resolution optical channel for non-destructive navigation and...

Ion detector for ion beam applications

Semiconductor copper line cutting method

Sample mount for performing sputter-deposition in a focused ion bea...

Dry etch process to edit copper lines

Method for electrically characterizing charge sensitive semiconduct...

Metal dry etch using electronic field

Focused ion beam process for removal of copper

Structure and method for charge sensitive electrical devices

Patents Applicationslast 30 patents

IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING

IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING

INLINE LOW-DAMAGE AUTOMATED FAILURE ANALYSIS

METHOD OF ACCESSING SEMICONDUCTOR CIRCUITS FROM THE BACKSIDE USING...

IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING A...

HIGH-RESOLUTION OPTICAL CHANNEL FOR NON-DESTRUCTIVE NAVIGATION AND...

IMPROVED ION DETECTOR FOR IONBEAM APPLICATIONS

APPARATUS AND METHOD FOR MANIPULATING SAMPLE TEMPERATURE FOR FOCUSE...

SYSTEM AND METHOD OF ALTERING A VERY SMALL SURFACE AREA BY MULTIPLE...

SYSTEM AND METHODS OF ALTERING A VERY SMALL SURFACE AREA

SAMPLE MOUNT FOR PERFORMING SPUTTER-DEPOSITION IN A FOCUSED ION BEA...

DRY ETCH PROCESS TO EDIT COPPER LINES

Dry etch process for copper

Metal dry etch using electronic field

Structure and method for charge sensitive electrical devices

Tool having a plurality of electrodes and corresponding method of a...

Semiconductor copper line cutting method

Structure and method for charge sensitive electrical devices

Focused ion beam process for removal of copper