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Steven Beringhause
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West Roxbury, MA, US
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last 30 patents
Information
Patent Grant
Hermetically sealed pressure sensing device
Patent number
6,272,927
Issue date
Aug 14, 2001
Texas Instruments Incorporated
Andrew A. Amatruda
G01 - MEASURING TESTING
Information
Patent Grant
Pressure transducer apparatus and method for making
Patent number
5,880,371
Issue date
Mar 9, 1999
Texas Instruments Incorporated
Steven Beringhause
G01 - MEASURING TESTING
Information
Patent Grant
High pressure sensor apparatus with low cost compact packaging system
Patent number
5,827,972
Issue date
Oct 27, 1998
Texas Instruments Incorporated
Richard J. Balcarek
G01 - MEASURING TESTING
Information
Patent Grant
Condition responsive electrical apparatus having improved low cost...
Patent number
5,822,173
Issue date
Oct 13, 1998
Texas Instruments Incorporated
Bryan J. Dague
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with improved strain gauge sensing means
Patent number
5,412,986
Issue date
May 9, 1995
Texas Instruments Incorporated
Steven Beringhause
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with strain isolated sensor
Patent number
5,343,748
Issue date
Sep 6, 1994
Texas Instruments Incorporated
Mark D. Mozgowiec
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive accelerometer with cantilever mount
Patent number
5,303,589
Issue date
Apr 19, 1994
Texas Instruments Incorporated
Eric P. Reidemeister
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive accelerometer
Patent number
5,239,871
Issue date
Aug 31, 1993
Texas Instruments Incorporated
Eric P. Reidemeister
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer
Patent number
5,233,873
Issue date
Aug 10, 1993
Texas Instruments Incorporated
Mark D. Mozgowiec
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with central mass in support
Patent number
5,121,180
Issue date
Jun 9, 1992
Texas Instruments Incorporated
Steven Beringhause
G01 - MEASURING TESTING
Information
Patent Grant
Speed/position sensor calibration method with angular adjustment of...
Patent number
5,021,736
Issue date
Jun 4, 1991
Texas Instruments Incorporated
Edward M. Gonsalves
G01 - MEASURING TESTING