Steven Boyle

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for monitoring and adjusting circuit performance
- Patent number 7,797,596
- Issue date Sep 14, 2010
- Oracle America, Inc.
- Anand Dixit
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring and profiling an integrated circui...
- Patent number 6,996,491
- Issue date Feb 7, 2006
- Sun Microsystems, Inc.
- Spencer M. Gold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated temperature sensor
- Patent number 6,893,154
- Issue date May 17, 2005
- Sun Microsystems, Inc.
- Spencer M. Gold
- G01 - MEASURING TESTING
Information Patent Grant
Efficient device debug system
- Patent number 6,472,900
- Issue date Oct 29, 2002
- Sun Microsystems, Inc.
- Deviprasad Malladi
- G01 - MEASURING TESTING
Information Patent Grant
Efficient debug package design
- Patent number 6,246,252
- Issue date Jun 12, 2001
- Sun Microsystems, Inc.
- Deviprasad Malladi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MONITORING AND ADJUSTING CIRCUIT PERFORMANCE
- Publication number 20090083598
- Publication date Mar 26, 2009
- Anand Dixit
- G01 - MEASURING TESTING
Information Patent Application
Integrated temperature sensor
- Publication number 20030156622
- Publication date Aug 21, 2003
- SUN MICROSYSTEMS, INC.
- Spencer M. Gold
- G01 - MEASURING TESTING
Information Patent Application
Method and system for monitoring and profiling an integrated circui...
- Publication number 20030158697
- Publication date Aug 21, 2003
- SUN MICROSYSTEMS, INC.
- Spencer M. Gold
- G06 - COMPUTING CALCULATING COUNTING