Steven C. Herring

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-channel frequency domain test and measurement instrument
- Patent number 9,157,943
- Issue date Oct 13, 2015
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Method of grouping waveforms for a single channel on a single display
- Patent number 9,026,945
- Issue date May 5, 2015
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument with common presentation of time do...
- Patent number 8,615,382
- Issue date Dec 24, 2013
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Region overlap control for autorange/autoset functions
- Patent number 8,482,564
- Issue date Jul 9, 2013
- Tektronix, Inc.
- Craig H. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Simple integrated control for zoom/pan functions
- Patent number 7,847,792
- Issue date Dec 7, 2010
- Tektronix, Inc.
- Scott R. Ketterer
- G01 - MEASURING TESTING
Information Patent Grant
User-placed marks in a long record length waveform
- Patent number 7,516,028
- Issue date Apr 7, 2009
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument having multi-channel telecommunicat...
- Patent number 6,778,931
- Issue date Aug 17, 2004
- Tektronix, Inc.
- Peter J. Letts
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
General purpose oscilloscope having digital television signal displ...
- Patent number 6,518,744
- Issue date Feb 11, 2003
- Tektronix, Inc.
- James L. Tallman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY
- Publication number 20120278763
- Publication date Nov 1, 2012
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DO...
- Publication number 20120197598
- Publication date Aug 2, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT
- Publication number 20120036947
- Publication date Feb 16, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
REGION OVERLAP CONTROL FOR AUTORANGE/AUTOSET FUNCTIONS
- Publication number 20090109226
- Publication date Apr 30, 2009
- Tektronix, Inc.
- Craig H. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Automatic Formation of Groups of Channels
- Publication number 20080192071
- Publication date Aug 14, 2008
- Tektronix, Inc.
- Steven C. Herring
- G01 - MEASURING TESTING
Information Patent Application
Indicia for Channels Collected Into a Group
- Publication number 20080191894
- Publication date Aug 14, 2008
- Tektronix, Inc.
- Evan A. Dickinson
- G01 - MEASURING TESTING
Information Patent Application
Simple integrated control for zoom/pan functions
- Publication number 20070035658
- Publication date Feb 15, 2007
- Scott R. Ketterer
- G01 - MEASURING TESTING
Information Patent Application
User-placed marks in a long record length waveform
- Publication number 20070038397
- Publication date Feb 15, 2007
- Keith D. Rule
- G01 - MEASURING TESTING

Steven C. Herring

Person

Patents Grantslast 30 patents

Multi-channel frequency domain test and measurement instrument

Method of grouping waveforms for a single channel on a single display

Test and measurement instrument with common presentation of time do...

Region overlap control for autorange/autoset functions

Simple integrated control for zoom/pan functions

User-placed marks in a long record length waveform

Test and measurement instrument having multi-channel telecommunicat...

General purpose oscilloscope having digital television signal displ...

Patents Applicationslast 30 patents

METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY

TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DO...

MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT

REGION OVERLAP CONTROL FOR AUTORANGE/AUTOSET FUNCTIONS

Automatic Formation of Groups of Channels

Indicia for Channels Collected Into a Group

Simple integrated control for zoom/pan functions

User-placed marks in a long record length waveform