Steven C. Leach

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Interference removal
- Patent number 5,946,082
- Issue date Aug 31, 1999
- Luxtron Corporation
- Herbert E. Litvak
- G01 - MEASURING TESTING
Information Patent Grant
Interference removal
- Patent number 5,786,886
- Issue date Jul 28, 1998
- Luxtron Corporation
- Herbert E. Litvak
- G01 - MEASURING TESTING
Information Patent Grant
Interference removal
- Patent number 5,414,504
- Issue date May 9, 1995
- Xinix, Inc.
- Herbert E. Litvak
- G01 - MEASURING TESTING
Information Patent Grant
Interference removal
- Patent number 5,208,644
- Issue date May 4, 1993
- Xinix, Inc.
- Herbert E. Litvak
- G01 - MEASURING TESTING
Information Patent Grant
Method of endpoint detection and structure therefor
- Patent number 5,190,614
- Issue date Mar 2, 1993
- Luxtron Corporation
- Steven C. Leach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for monitoring radiant energy signals with var...
- Patent number 5,138,149
- Issue date Aug 11, 1992
- Xinix, Inc.
- Raymond J. Cadet
- G01 - MEASURING TESTING