Steven C. Nash

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,996,000
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,989,843
- Issue date Jun 5, 2018
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,372,394
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for feature function aware priority printing
- Patent number 8,586,950
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for feature function aware priority printing
- Patent number 8,227,774
- Issue date Jul 24, 2012
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Low stress electrodeposition of gold for x-ray mask fabrication
- Patent number 5,459,001
- Issue date Oct 17, 1995
- International Business Machines Corporation
- Scott A. Estes
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Low stress electrodeposition of gold for X-ray mask fabrication
- Patent number 5,318,687
- Issue date Jun 7, 1994
- International Business Machines Corporation
- Scott A. Estes
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20160223902
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20160224720
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20150212405
- Publication date Jul 30, 2015
- Toppan Printing Co., Ltd.
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING
- Publication number 20120204136
- Publication date Aug 9, 2012
- International Business Machines Corporation
- Brian Neal CALDWELL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING
- Publication number 20110165502
- Publication date Jul 7, 2011
- INTERNATIONAL BUINESS MACHINE CORPORATION
- Brian Neal CALDWELL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Steven C. Nash

Person

Patents Grantslast 30 patents

Test pattern layout for test photomask and method for evaluating cr...

Test pattern layout for test photomask and method for evaluating cr...

Test pattern layout for test photomask and method for evaluating cr...

Method and system for feature function aware priority printing

Method and system for feature function aware priority printing

Low stress electrodeposition of gold for x-ray mask fabrication

Low stress electrodeposition of gold for X-ray mask fabrication

Patents Applicationslast 30 patents

TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...

TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...

TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...

METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING

METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING