Steven Draving

Person

Colorado Springs, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,674,993
- Issue date Jun 13, 2023
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing error in time domain waveform of a s...
- Patent number 11,604,213
- Issue date Mar 14, 2023
- Keysight Technologies, Inc.
- Steven Draving
- G01 - MEASURING TESTING
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,536,761
- Issue date Dec 27, 2022
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,255,893
- Issue date Feb 22, 2022
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
System and method of analyzing crosstalk induced jitter
- Patent number 10,200,085
- Issue date Feb 5, 2019
- Keysight Technologies, Inc.
- David L. Gines
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Jitter analysis systems and methods
- Patent number 10,142,066
- Issue date Nov 27, 2018
- Keysight Technologies, Inc.
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of analyzing crosstalk and intersymbol interferen...
- Patent number 10,033,554
- Issue date Jul 24, 2018
- Keysight Technologies, Inc.
- David L. Gines
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of analyzing crosstalk without measuring aggresso...
- Patent number 9,673,862
- Issue date Jun 6, 2017
- Keysight Technologies, Inc.
- David L. Gines
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for determining equalization coefficients
- Patent number 8,223,830
- Issue date Jul 17, 2012
- Agilent Technologies, Inc.
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of finding data dependent timing and voltage jitter for diff...
- Patent number 7,480,329
- Issue date Jan 20, 2009
- Agilent Technologies, Inc.
- Steven D Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for equalizing a digital signal through removal of data depe...
- Patent number 7,480,355
- Issue date Jan 20, 2009
- Agilent Technologies, Inc.
- Steven D Draving
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus using re-sampled tie records to characterize j...
- Patent number 7,460,591
- Issue date Dec 2, 2008
- Agilent Technologies, Inc.
- Steven D Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Finding random jitter in an arbitrary non-repeating data signal
- Patent number 7,251,572
- Issue date Jul 31, 2007
- Agilent Technologies, Inc.
- Steven D Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Finding data dependent jitter with a DDJ calculator configured by r...
- Patent number 7,248,982
- Issue date Jul 24, 2007
- Agilent Technologies, Inc.
- Steven D Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for decomposing signal jitter using multiple a...
- Patent number 6,898,535
- Issue date May 24, 2005
- Agilent Technologies, Inc.
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Trigger jitter reduction for an internally triggered real time digi...
- Patent number 6,753,677
- Issue date Jun 22, 2004
- Agilent Technologies, Inc.
- Dennis J Weller
- G01 - MEASURING TESTING
Information Patent Grant
Wide-bandwidth probe using pole-zero cancellation
- Patent number 6,483,284
- Issue date Nov 19, 2002
- Agilent Technologies, Inc.
- David D. Eskeldson
- G01 - MEASURING TESTING
Information Patent Grant
Method for edge mounting flex media to a rigid PC board
- Patent number 6,378,757
- Issue date Apr 30, 2002
- Agilent Technologies, Inc.
- Brent A. Holcombe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic probe for measuring high impedance tri-state logic circuits
- Patent number 6,362,614
- Issue date Mar 26, 2002
- Agilent Technologies, Inc.
- Steven D Draving
- G01 - MEASURING TESTING
Information Patent Grant
Split resistor probe and method
- Patent number 6,362,635
- Issue date Mar 26, 2002
- Agilent Technologies, Inc.
- Steven D Draving
- G01 - MEASURING TESTING
Information Patent Grant
Incident-edge detecting probe
- Patent number 6,262,602
- Issue date Jul 17, 2001
- Agilent Technologies, Inc.
- Steven D. Draving
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Split resistor probe and method
- Patent number 6,225,816
- Issue date May 1, 2001
- Agilent Technologies, Inc.
- Steven D Draving
- G01 - MEASURING TESTING
Information Patent Grant
Electronic probe for measuring high impedance tri-state logic circuits
- Patent number 6,175,228
- Issue date Jan 16, 2001
- Agilent Technologies
- Thomas J. Zamborelli
- G01 - MEASURING TESTING
Information Patent Grant
Voltage multiplexed chip I/O for multi-chip modules
- Patent number 5,815,100
- Issue date Sep 29, 1998
- Hewlett-Packard Company
- Kenneth Rush
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pseudo-random repetitive sampling of a signal
- Patent number 5,315,627
- Issue date May 24, 1994
- Hewlett-Packard Company
- Steven D. Draving
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20220082603
- Publication date Mar 17, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20220082604
- Publication date Mar 17, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20200064386
- Publication date Feb 27, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING EQUALIZATION COEFFICIENTS
- Publication number 20100322299
- Publication date Dec 23, 2010
- AGILENT TECHNOLOGIES, INC.
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Finding Low Frequency Random and Periodic Jitter in High Speed Digi...
- Publication number 20080056341
- Publication date Mar 6, 2008
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for equalizing a digital signal through removal of data depe...
- Publication number 20060182205
- Publication date Aug 17, 2006
- Steven D. Draving
- G11 - INFORMATION STORAGE
Information Patent Application
Method of finding data dependent timing and voltage jitter for diff...
- Publication number 20060093027
- Publication date May 4, 2006
- AGILENT TECHNOLOGIES, INC.
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus use re-sampled tie records to characterize jit...
- Publication number 20060045175
- Publication date Mar 2, 2006
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR DECOMPOSING SIGNAL JITTER USING MULTIPLE A...
- Publication number 20050080574
- Publication date Apr 14, 2005
- Steven D. Draving
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and method for clock recovery and eye diagram generation
- Publication number 20040183518
- Publication date Sep 23, 2004
- Dennis J. Weller
- G01 - MEASURING TESTING
Information Patent Application
Electronic probe for measuring high impedance tri-state logic circuits
- Publication number 20010024116
- Publication date Sep 27, 2001
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
Split resistor probe and method
- Publication number 20010002794
- Publication date Jun 7, 2001
- Steven D. Draving
- G01 - MEASURING TESTING

Steven Draving

Person

Patents Grantslast 30 patents

Measuring error in signal under test (SUT) using multiple channel m...

System and method for reducing error in time domain waveform of a s...

Measuring error in signal under test (SUT) using multiple channel m...

Measuring error in signal under test (SUT) using multiple channel m...

System and method of analyzing crosstalk induced jitter

Jitter analysis systems and methods

System and method of analyzing crosstalk and intersymbol interferen...

System and method of analyzing crosstalk without measuring aggresso...

Method and apparatus for determining equalization coefficients

Method of finding data dependent timing and voltage jitter for diff...

Method for equalizing a digital signal through removal of data depe...

Method and apparatus using re-sampled tie records to characterize j...

Finding random jitter in an arbitrary non-repeating data signal

Finding data dependent jitter with a DDJ calculator configured by r...

Method and apparatus for decomposing signal jitter using multiple a...

Trigger jitter reduction for an internally triggered real time digi...

Wide-bandwidth probe using pole-zero cancellation

Method for edge mounting flex media to a rigid PC board

Electronic probe for measuring high impedance tri-state logic circuits

Split resistor probe and method

Incident-edge detecting probe

Split resistor probe and method

Electronic probe for measuring high impedance tri-state logic circuits

Voltage multiplexed chip I/O for multi-chip modules

Pseudo-random repetitive sampling of a signal

Patents Applicationslast 30 patents

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

METHOD AND APPARATUS FOR DETERMINING EQUALIZATION COEFFICIENTS

Finding Low Frequency Random and Periodic Jitter in High Speed Digi...

Method for equalizing a digital signal through removal of data depe...

Method of finding data dependent timing and voltage jitter for diff...

Method and apparatus use re-sampled tie records to characterize jit...

METHOD AND APPARATUS FOR DECOMPOSING SIGNAL JITTER USING MULTIPLE A...

Apparatus and method for clock recovery and eye diagram generation

Electronic probe for measuring high impedance tri-state logic circuits

Split resistor probe and method