Steven E. Green

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mounting for deviation angle self compensating substantially achrom...
- Patent number 8,462,341
- Issue date Jun 11, 2013
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
UV-IR range variable angle spectroscopic ellipsometer
- Patent number 8,253,940
- Issue date Aug 28, 2012
- J. A. Woollam Co., Inc.
- Steven E. Green
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system and method of use
- Patent number 8,159,672
- Issue date Apr 17, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Method of constructing a deviation angle self compensating substant...
- Patent number 7,907,280
- Issue date Mar 15, 2011
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system
- Patent number 7,623,237
- Issue date Nov 24, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Deviation angle self compensating substantially achromatic retarder
- Patent number 7,460,230
- Issue date Dec 2, 2008
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G02 - OPTICS
Information Patent Grant
Deviation angle self compensating substantially achromatic retarder
- Patent number 7,450,231
- Issue date Nov 11, 2008
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,336,361
- Issue date Feb 26, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer, ellipsometer, polarimeter and the like systems
- Patent number 7,327,456
- Issue date Feb 5, 2008
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Rotating or rotatable compensator system providing aberation correc...
- Patent number 7,304,737
- Issue date Dec 4, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Control of uncertain angle of incidence of beam from Arc lamp
- Patent number 7,301,631
- Issue date Nov 27, 2007
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Accurate determination of refractive indices of solid, fluid and li...
- Patent number 7,280,194
- Issue date Oct 9, 2007
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Sample entry purge system in spectrophotometer, ellipsometer, polar...
- Patent number 7,274,450
- Issue date Sep 25, 2007
- J. A. Woollam Co., Inc.
- Steven E. Green
- G01 - MEASURING TESTING
Information Patent Grant
Combined spatial filter and relay systems in rotating compensator e...
- Patent number 7,245,376
- Issue date Jul 17, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Broadband ellipsometer or polarimeter system including at least one...
- Patent number 7,215,424
- Issue date May 8, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Rotating or rotatable compensator spectroscopic ellipsometer system...
- Patent number 7,193,710
- Issue date Mar 20, 2007
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Methodology for providing good data at all wavelengths over a spect...
- Patent number 7,151,605
- Issue date Dec 19, 2006
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Alignment of ellipsometer beam to sample surface
- Patent number 7,136,162
- Issue date Nov 14, 2006
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Discrete polarization state rotatable compensator spectroscopic ell...
- Patent number 7,075,649
- Issue date Jul 11, 2006
- J. A. Woollam Co.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer, ellipsometer, polarimeter and the like systems
- Patent number 6,982,792
- Issue date Jan 3, 2006
- J. A. Woollam Co. Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Methodology for improving precision of data acquired by spectrophot...
- Patent number 6,831,740
- Issue date Dec 14, 2004
- J. A. Woollam Co. Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Odd bounce image rotation system in ellipsometer systems
- Patent number 6,795,184
- Issue date Sep 21, 2004
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Positionable multiple detector system for spectrophotomer, ellipsom...
- Patent number 6,535,286
- Issue date Mar 18, 2003
- J. A. Woollam Co. Inc.
- Steven E. Green
- G01 - MEASURING TESTING
Information Patent Grant
Beam splitting analyzer means in rotating compensator ellipsometer
- Patent number 6,483,586
- Issue date Nov 19, 2002
- J. A. Woollam Co. Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Single trianglular shaped optical retarder element for use in spect...
- Patent number 6,141,102
- Issue date Oct 31, 2000
- J. A. Woolam Co. INC
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Multiple tipped berek plate optical retarder elements for use in sp...
- Patent number 6,118,537
- Issue date Sep 12, 2000
- J. A. Woollam Co. Inc.
- Blaine D. Johs
- G02 - OPTICS
Information Patent Grant
Dual horizontally oriented triangle shaped optical retarder element...
- Patent number 6,100,981
- Issue date Aug 8, 2000
- J. A. Woollam Co. Inc.
- Blaine D. Johs
- G02 - OPTICS
Information Patent Grant
Parallelogram shaped optical retarder element for use in spectrosco...
- Patent number 6,084,674
- Issue date Jul 4, 2000
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G02 - OPTICS
Information Patent Grant
Dual vertically oriented triangular shaped optical retarder element...
- Patent number 5,963,325
- Issue date Oct 5, 1999
- J. A. Woollam Co. Inc.
- Blaine D. Johs
- G02 - OPTICS
Information Patent Grant
System and method for improving data acquisition capability in spec...
- Patent number 5,956,145
- Issue date Sep 21, 1999
- J. A. Woollam Co. Inc.
- Steven E. Green
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Mounting for deviation angle self compensating substantially achrom...
- Publication number 20110188040
- Publication date Aug 4, 2011
- Ping He
- G01 - MEASURING TESTING
Information Patent Application
Method of constructing a deviation angle self compensating substant...
- Publication number 20090091758
- Publication date Apr 9, 2009
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Deviation angle self compensating substantially achromatic retarder
- Publication number 20080100842
- Publication date May 1, 2008
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Deviation angle self compensating substantially achromatic retarder
- Publication number 20070253059
- Publication date Nov 1, 2007
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Methodology for improving precision of data acquired by spectrophot...
- Publication number 20020085200
- Publication date Jul 4, 2002
- Craig M. Herzinger
- G01 - MEASURING TESTING

Steven E. Green

Person

Patents Grantslast 30 patents

Mounting for deviation angle self compensating substantially achrom...

UV-IR range variable angle spectroscopic ellipsometer

Sample investigating system and method of use

Method of constructing a deviation angle self compensating substant...

Sample investigating system

Deviation angle self compensating substantially achromatic retarder

Deviation angle self compensating substantially achromatic retarder

Spectroscopic ellipsometer and polarimeter systems

Spectrophotometer, ellipsometer, polarimeter and the like systems

Rotating or rotatable compensator system providing aberation correc...

Control of uncertain angle of incidence of beam from Arc lamp

Accurate determination of refractive indices of solid, fluid and li...

Sample entry purge system in spectrophotometer, ellipsometer, polar...

Combined spatial filter and relay systems in rotating compensator e...

Broadband ellipsometer or polarimeter system including at least one...

Rotating or rotatable compensator spectroscopic ellipsometer system...

Methodology for providing good data at all wavelengths over a spect...

Alignment of ellipsometer beam to sample surface

Discrete polarization state rotatable compensator spectroscopic ell...

Spectrophotometer, ellipsometer, polarimeter and the like systems

Methodology for improving precision of data acquired by spectrophot...

Odd bounce image rotation system in ellipsometer systems

Positionable multiple detector system for spectrophotomer, ellipsom...

Beam splitting analyzer means in rotating compensator ellipsometer

Single trianglular shaped optical retarder element for use in spect...

Multiple tipped berek plate optical retarder elements for use in sp...

Dual horizontally oriented triangle shaped optical retarder element...

Parallelogram shaped optical retarder element for use in spectrosco...

Dual vertically oriented triangular shaped optical retarder element...

System and method for improving data acquisition capability in spec...

Patents Applicationslast 30 patents

Mounting for deviation angle self compensating substantially achrom...

Method of constructing a deviation angle self compensating substant...

Deviation angle self compensating substantially achromatic retarder

Deviation angle self compensating substantially achromatic retarder

Combined spatial filter and relay systems in rotating compensator e...

Methodology for improving precision of data acquired by spectrophot...