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Steven E. Snyder
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New Boston, NH, US
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last 30 patents
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Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
11,585,868
Issue date
Feb 21, 2023
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor with an adjustable threshold
Patent number
11,454,521
Issue date
Sep 27, 2022
ALLEGRO MICROSYSTEMS, LLC
Philip Suyderhoud
G01 - MEASURING TESTING
Information
Patent Grant
Sensor output control methods and apparatus
Patent number
11,029,370
Issue date
Jun 8, 2021
ALLEGRO MICROSYSTEMS, LLC
Jonathan Zimmermann
G01 - MEASURING TESTING
Information
Patent Grant
Digital interpolation of switch point to reduce switch point jitter
Patent number
10,866,288
Issue date
Dec 15, 2020
ALLEGRO MICROSYSTEMS, LLC
Steven E. Snyder
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Dual edge synchronization of analog input to reduce switch point ji...
Patent number
10,797,851
Issue date
Oct 6, 2020
ALLEGRO MICROSYSTEMS, LLC
Jay M. Towne
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
10,782,363
Issue date
Sep 22, 2020
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for error detection in a magnetic field sensor
Patent number
10,156,461
Issue date
Dec 18, 2018
ALLEGRO MICROSYSTEMS, LLC
Steven E. Snyder
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
9,851,416
Issue date
Dec 26, 2017
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for limiting a smallest separation of threshol...
Patent number
9,778,326
Issue date
Oct 3, 2017
Allegro Microsystems, LLC
Michael Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC FIELD SENSOR WITH AN ADJUSTABLE THRESHOLD
Publication number
20220107207
Publication date
Apr 7, 2022
ALLEGRO MICROSYSTEMS, LLC
Philip Suyderhoud
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MAGNETIC FIELD SENSORS WITH SELF-TEST
Publication number
20200379061
Publication date
Dec 3, 2020
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL INTERPOLATION OF SWITCH POINT TO REDUCE SWITCH POINT JITTER
Publication number
20200363481
Publication date
Nov 19, 2020
ALLEGRO MICROSYSTEMS, LLC
Steven E. Snyder
G01 - MEASURING TESTING
Information
Patent Application
DUAL EDGE SYNCHRONIZATION OF ANALOG INPUT TO REDUCE SWITCH POINT JI...
Publication number
20190334692
Publication date
Oct 31, 2019
ALLEGRO MICROSYSTEMS, LLC
Jay M. Towne
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Systems And Methods For Magnetic Field Sensors With Self-Test
Publication number
20180088184
Publication date
Mar 29, 2018
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR ERROR DETECTION IN A MAGNETIC FIELD SENSOR
Publication number
20160123780
Publication date
May 5, 2016
Allegro Microsystems, LLC
Steven E. Snyder
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Magnetic Field Sensors with Self-Test
Publication number
20160025820
Publication date
Jan 28, 2016
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
Circuits and Methods for Limiting a Smallest Separation of Threshol...
Publication number
20150260803
Publication date
Sep 17, 2015
Allegro Microsystems, LLC
Michael Chen
G01 - MEASURING TESTING