Steven G. Eaton

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for sensing a sample
- Patent number 7,278,301
- Issue date Oct 9, 2007
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
System for sensing a sample
- Patent number 6,931,917
- Issue date Aug 23, 2005
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
System for sensing a sample
- Patent number 6,520,005
- Issue date Feb 18, 2003
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 6,267,005
- Issue date Jul 31, 2001
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 5,948,972
- Issue date Sep 7, 1999
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Constant-force profilometer with stylus-stabilizing sensor assembly...
- Patent number 5,705,741
- Issue date Jan 6, 1998
- Tencor Instruments
- Steven G. Eaton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System for Sensing a Sample
- Publication number 20060230819
- Publication date Oct 19, 2006
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
System for Sensing a Sample
- Publication number 20060207318
- Publication date Sep 21, 2006
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
System for sensing a sample
- Publication number 20050262931
- Publication date Dec 1, 2005
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
System for sensing a sample
- Publication number 20040118193
- Publication date Jun 24, 2004
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20030089162
- Publication date May 15, 2003
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
System for sensing a sample
- Publication number 20030089163
- Publication date May 15, 2003
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SENSING A SAMPLE
- Publication number 20020174714
- Publication date Nov 28, 2002
- THOMAS MCWAID
- B82 - NANO-TECHNOLOGY
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20010047682
- Publication date Dec 6, 2001
- Amin Samsavar
- B82 - NANO-TECHNOLOGY

Steven G. Eaton

Person

Patents Grantslast 30 patents

System for sensing a sample

Dual stage instrument for scanning a specimen

System for sensing a sample

System for sensing a sample

Dual stage instrument for scanning a specimen

Dual stage instrument for scanning a specimen

Constant-force profilometer with stylus-stabilizing sensor assembly...

Patents Applicationslast 30 patents

System for Sensing a Sample

System for Sensing a Sample

System for sensing a sample

Dual stage instrument for scanning a specimen

System for sensing a sample

Dual stage instrument for scanning a specimen

System for sensing a sample

SYSTEM FOR SENSING A SAMPLE

Dual stage instrument for scanning a specimen