Steven G. H. Anderson

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with upset event detection and method of making
- Patent number 9,702,925
- Issue date Jul 11, 2017
- NXP USA, INC.
- Mark D. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for removing nanoclusters from selected regions
- Patent number 6,964,902
- Issue date Nov 15, 2005
- FREESCALE SEMICONDUCTOR, INC.
- Robert F. Steimle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electronic structure using etch
- Patent number 6,849,487
- Issue date Feb 1, 2005
- Motorola, Inc.
- William J. Taylor, Jr.
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH UPSET EVENT DETECTION AND METHOD OF MAKING
- Publication number 20160109506
- Publication date Apr 21, 2016
- MARK D. HALL
- G01 - MEASURING TESTING
Information Patent Application
Method for removing nanoclusters from selected regions
- Publication number 20050191808
- Publication date Sep 1, 2005
- Robert F. Steimle
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR FORMING AN ELECTRONIC STRUCTURE USING ETCH
- Publication number 20040253799
- Publication date Dec 16, 2004
- William J. Taylor
- B82 - NANO-TECHNOLOGY