Steven George Barbee

Person

Amenia, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Uplift modeling
- Patent number 11,562,400
- Issue date Jan 24, 2023
- International Business Machines Corporation
- Jing Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying optimal weights to improve prediction accuracy in machi...
- Patent number 11,443,235
- Issue date Sep 13, 2022
- International Business Machines Corporation
- Jing Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting service request breaches
- Patent number 9,189,543
- Issue date Nov 17, 2015
- International Business Machines Corporation
- Yogesh P. Badhe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined feature creation to increase data mining signal in hybrid...
- Patent number 7,953,689
- Issue date May 31, 2011
- International Business Machines Corporation
- Steven George Barbee
- G05 - CONTROLLING REGULATING
Information Patent Grant
Data mining using variable rankings and enhanced visualization methods
- Patent number 7,895,168
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Steven G. Barbee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of fabricating optimization involving process sequence anal...
- Patent number 7,502,658
- Issue date Mar 10, 2009
- International Business Machines Corporation
- Steven G. Barbee
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Enhanced endpoint detection for wet etch process control
- Patent number 6,989,683
- Issue date Jan 24, 2006
- International Business Machines Corporation
- Leping Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for detecting CMP endpoint in acidic slurries
- Patent number 6,899,784
- Issue date May 31, 2005
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
Method for detecting CMP endpoint in acidic slurries
- Patent number 6,878,629
- Issue date Apr 12, 2005
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
Low defect pre-emitter and pre-base oxide etch for bipolar transist...
- Patent number 6,858,532
- Issue date Feb 22, 2005
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced endpoint detection for wet etch process control
- Patent number 6,843,880
- Issue date Jan 18, 2005
- International Business Machines Corporation
- Leping Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Endpoint detection in chemical-mechanical polishing of cloisonne st...
- Patent number 6,291,351
- Issue date Sep 18, 2001
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
In-situ monitoring and control of conductive films by detecting cha...
- Patent number 6,072,313
- Issue date Jun 6, 2000
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Real time measurement of etch rate during a chemical etching process
- Patent number 5,788,801
- Issue date Aug 4, 1998
- International Business Machines Corporation
- Steven George Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Rotary signal coupling for chemical mechanical polishing endpoint d...
- Patent number 5,770,948
- Issue date Jun 23, 1998
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
In-situ monitoring of the change in thickness of films
- Patent number 5,731,697
- Issue date Mar 24, 1998
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for chemical vapor deposition of aluminum oxide
- Patent number 5,728,222
- Issue date Mar 17, 1998
- International Business Machines Corporation
- Steven George Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Rotary signal coupling for chemical mechanical polishing endpoint d...
- Patent number 5,663,637
- Issue date Sep 2, 1997
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
In-situ monitoring of conductive films on semiconductor wafers
- Patent number 5,660,672
- Issue date Aug 26, 1997
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical polishing endpoint process control
- Patent number 5,659,492
- Issue date Aug 19, 1997
- International Business Machines Corporation
- Leping Li
- B24 - GRINDING POLISHING
Information Patent Grant
Aluminum oxide LPCVD system
- Patent number 5,648,113
- Issue date Jul 15, 1997
- International Business Machines Corporation
- Steven George Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Endpoint detection for chemical mechanical polishing using frequenc...
- Patent number 5,644,221
- Issue date Jul 1, 1997
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for chemical vapor deposition of aluminum oxide
- Patent number 5,614,247
- Issue date Mar 25, 1997
- International Business Machines Corporation
- Steven G. Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Real time measurement of etch rate during a chemical etching process
- Patent number 5,582,746
- Issue date Dec 10, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Chemical etch monitor for measuring film etching uniformity during...
- Patent number 5,573,624
- Issue date Nov 12, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus for contactless real-time in-situ monitoring of a chemica...
- Patent number 5,573,623
- Issue date Nov 12, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
In-situ monitoring of the change in thickness of films
- Patent number 5,559,428
- Issue date Sep 24, 1996
- International Business Machines Corporation
- Leping Li
- G01 - MEASURING TESTING
Information Patent Grant
Aluminum oxide LPCVD system
- Patent number 5,540,777
- Issue date Jul 30, 1996
- International Business Machines Corporation
- Steven G. Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Contactless real-time in-situ monitoring of a chemical etching
- Patent number 5,516,399
- Issue date May 14, 1996
- International Business Machines Corporation
- Michael J. Balconi-Lamica
- B24 - GRINDING POLISHING
Information Patent Grant
Minimizing overetch during a chemical etching process
- Patent number 5,501,766
- Issue date Mar 26, 1996
- International Business Machines Corporation
- Steven G. Barbee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FRAUD SUSPECTS DETECTION AND VISUALIZATION
- Publication number 20230083118
- Publication date Mar 16, 2023
- International Business Machines Corporation
- Steven George Barbee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Feature Generation for Training Data Sets Based on Unlabeled Data
- Publication number 20230073137
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Jing Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING OPTIMAL WEIGHTS TO IMPROVE PREDICTION ACCURACY IN MACHI...
- Publication number 20220292401
- Publication date Sep 15, 2022
- International Business Machines Corporation
- Jing Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PARTITIONING WITH NEURAL NETWORK
- Publication number 20220156572
- Publication date May 19, 2022
- International Business Machines Corporation
- Si Er Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT EXECUTION OF A DECISION TREE
- Publication number 20220092437
- Publication date Mar 24, 2022
- International Business Machines Corporation
- Jing Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA-DRIVEN TECHNIQUES FOR MODEL ENSEMBLES
- Publication number 20210342707
- Publication date Nov 4, 2021
- International Business Machines Corporation
- JING XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING OPTIMAL WEIGHTS TO IMPROVE PREDICTION ACCURACY IN MACHI...
- Publication number 20210150407
- Publication date May 20, 2021
- International Business Machines Corporation
- Jing Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Partitioning with Quality Evaluation
- Publication number 20210142213
- Publication date May 13, 2021
- International Business Machines Corporation
- Si Er Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTING SERVICE REQUEST BREACHES
- Publication number 20130132060
- Publication date May 23, 2013
- International Business Machines Corporation
- Yogesh P. Badhe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MINING USING VARIABLE RANKINGS AND ENHANCED VISUALIZATION METHODS
- Publication number 20090177682
- Publication date Jul 9, 2009
- International Business Machines Corporation
- Steven G. Barbee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Combined Feature Creation to Increase Data Mining Signal in Hybrid...
- Publication number 20090157594
- Publication date Jun 18, 2009
- Steven George Barbee
- G05 - CONTROLLING REGULATING
Information Patent Application
Enhanced endpoint detection for wet etch process control
- Publication number 20050006027
- Publication date Jan 13, 2005
- Leping Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Low defect pre-emitter and pre-base oxide etch for bipolar transist...
- Publication number 20040110354
- Publication date Jun 10, 2004
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Enhanced endpoint detection for wet etch process control
- Publication number 20030217990
- Publication date Nov 27, 2003
- International Business Machines Corporation
- Leping Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Steven George Barbee

Person

Patents Grantslast 30 patents

Uplift modeling

Identifying optimal weights to improve prediction accuracy in machi...

Predicting service request breaches

Combined feature creation to increase data mining signal in hybrid...

Data mining using variable rankings and enhanced visualization methods

Methods of fabricating optimization involving process sequence anal...

Enhanced endpoint detection for wet etch process control

Apparatus for detecting CMP endpoint in acidic slurries

Method for detecting CMP endpoint in acidic slurries

Low defect pre-emitter and pre-base oxide etch for bipolar transist...

Enhanced endpoint detection for wet etch process control

Endpoint detection in chemical-mechanical polishing of cloisonne st...

In-situ monitoring and control of conductive films by detecting cha...

Real time measurement of etch rate during a chemical etching process

Rotary signal coupling for chemical mechanical polishing endpoint d...

In-situ monitoring of the change in thickness of films

Apparatus for chemical vapor deposition of aluminum oxide

Rotary signal coupling for chemical mechanical polishing endpoint d...

In-situ monitoring of conductive films on semiconductor wafers

Chemical mechanical polishing endpoint process control

Aluminum oxide LPCVD system

Endpoint detection for chemical mechanical polishing using frequenc...

Apparatus for chemical vapor deposition of aluminum oxide

Real time measurement of etch rate during a chemical etching process

Chemical etch monitor for measuring film etching uniformity during...

Apparatus for contactless real-time in-situ monitoring of a chemica...

In-situ monitoring of the change in thickness of films

Aluminum oxide LPCVD system

Contactless real-time in-situ monitoring of a chemical etching

Minimizing overetch during a chemical etching process

Patents Applicationslast 30 patents

FRAUD SUSPECTS DETECTION AND VISUALIZATION

Feature Generation for Training Data Sets Based on Unlabeled Data

IDENTIFYING OPTIMAL WEIGHTS TO IMPROVE PREDICTION ACCURACY IN MACHI...

DATA PARTITIONING WITH NEURAL NETWORK

EFFICIENT EXECUTION OF A DECISION TREE

DATA-DRIVEN TECHNIQUES FOR MODEL ENSEMBLES

IDENTIFYING OPTIMAL WEIGHTS TO IMPROVE PREDICTION ACCURACY IN MACHI...

Data Partitioning with Quality Evaluation

PREDICTING SERVICE REQUEST BREACHES

DATA MINING USING VARIABLE RANKINGS AND ENHANCED VISUALIZATION METHODS

Combined Feature Creation to Increase Data Mining Signal in Hybrid...

Enhanced endpoint detection for wet etch process control

Low defect pre-emitter and pre-base oxide etch for bipolar transist...

Enhanced endpoint detection for wet etch process control