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Steven J. Huff
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Hartland, WI, US
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last 30 patents
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Patent Grant
Method and apparatus to reduce the effects of maxwell terms and oth...
Patent number
6,528,998
Issue date
Mar 4, 2003
GE Medical Systems Global Technology Co., LLC
Xiaohong Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to reduce perturbation field effects in MR ima...
Patent number
6,469,505
Issue date
Oct 22, 2002
GE Medical Systems Global Technology Co., LLC
Joseph K. Maier
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for producing diffusion weighted MR images
Patent number
6,323,646
Issue date
Nov 27, 2001
General Electric Company
Xiaohong Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for identifying errors in magnetic resonance i...
Patent number
6,239,599
Issue date
May 29, 2001
General Electric Company
Xiaohong Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Method for quantifying ghost artifacts in MR images
Patent number
6,100,689
Issue date
Aug 8, 2000
General Electric Company
Steven J. Huff
G01 - MEASURING TESTING