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Steven J. VanKerkhove
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Rochester, NY, US
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last 30 patents
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Patent Grant
Interferometer with catadioptric imaging system having expanded ran...
Patent number
5,757,493
Issue date
May 26, 1998
Tropel Corporation
Steven J. VanKerkhove
G01 - MEASURING TESTING
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Patent Grant
Large aperture reflective interferometer for measuring convex spher...
Patent number
5,155,554
Issue date
Oct 13, 1992
General Signal Corporation
George K. Schnable
G01 - MEASURING TESTING