Steven Jenkins

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of estimation of wafer polish rates
- Patent number 6,799,136
- Issue date Sep 28, 2004
- Texas Instruments Incorporated
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Grant
System and method for self-tuning feedback control of a system
- Patent number 6,631,299
- Issue date Oct 7, 2003
- Texas Instruments Incorporated
- Nital S. Patel
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of estimation of wafer-to-wafer thickness
- Patent number 6,589,800
- Issue date Jul 8, 2003
- Texas Instruments Incorporated
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Grant
Method and system for dispatching semiconductor lots to manufacturi...
- Patent number 6,584,369
- Issue date Jun 24, 2003
- Texas Instruments Incorporated
- Nital S. Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Infrared scanner
- Patent number 5,869,945
- Issue date Feb 9, 1999
- Raytheon TI Systems, Inc.
- Humphrey Wing-Hong Ha
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Method of estimation of wafer-to-wafer thickness
- Publication number 20030059963
- Publication date Mar 27, 2003
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Application
Method of estimation of wafer polish rates
- Publication number 20030054644
- Publication date Mar 20, 2003
- Nital Patel
- B24 - GRINDING POLISHING
Information Patent Application
Method and system for dispatching semiconductor lots to manufacturi...
- Publication number 20020107599
- Publication date Aug 8, 2002
- Nital S. Patel
- G06 - COMPUTING CALCULATING COUNTING