Membership
Tour
Register
Log in
Steven John Buckley
Follow
Person
Henlow, GB
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
LIDAR system with dynamic resolution
Patent number
12,123,980
Issue date
Oct 22, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Ivan Koudar
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for repetitive histogramming
Patent number
12,055,665
Issue date
Aug 6, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Steven John Buckley
G04 - HOROLOGY
Information
Patent Grant
Methods and apparatus for histogramming
Patent number
11,982,770
Issue date
May 14, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Colin Barry
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for repetitive histogramming
Patent number
11,592,535
Issue date
Feb 28, 2023
Semiconductor Components Industries, LLC
Steven John Buckley
G04 - HOROLOGY
Information
Patent Grant
Methods and apparatus for selective histogramming
Patent number
10,895,848
Issue date
Jan 19, 2021
Semiconductor Components Industries, LLC
Steven John Buckley
G04 - HOROLOGY
Information
Patent Grant
Histogram readout method and circuit for determining the time of fl...
Patent number
10,416,293
Issue date
Sep 17, 2019
SensL Technologies Ltd.
Steven John Buckley
G04 - HOROLOGY
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUS FOR REPETITIVE HISTOGRAMMING
Publication number
20240353537
Publication date
Oct 24, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Steven John BUCKLEY
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR REPETITIVE HISTOGRAMMING
Publication number
20230141972
Publication date
May 11, 2023
Semiconductor Components Industries, LLC
Steven John BUCKLEY
G04 - HOROLOGY
Information
Patent Application
METHODS AND APPARATUS FOR HISTOGRAMMING
Publication number
20220171037
Publication date
Jun 2, 2022
Semiconductor Components Industries, LLC
Colin BARRY
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR SELECTIVE HISTOGRAMMING
Publication number
20210294274
Publication date
Sep 23, 2021
Semiconductor Components Industries, LLC
Steven John BUCKLEY
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR REPETITIVE HISTOGRAMMING
Publication number
20210255285
Publication date
Aug 19, 2021
Semiconductor Components Industries, LLC
Steven John BUCKLEY
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM WITH DYNAMIC RESOLUTION
Publication number
20210223372
Publication date
Jul 22, 2021
Semiconductor Components Industries, LLC
Ivan KOUDAR
G01 - MEASURING TESTING
Information
Patent Application
Histogram Readout Method and Circuit for Determining the Time of Fl...
Publication number
20180164415
Publication date
Jun 14, 2018
SENSL TECHNOLOGIES LTD.
Steven John Buckley
G04 - HOROLOGY