Steven John Buckley

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Henlow, GB

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for histogramming
- Patent number 11,982,770
- Issue date May 14, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Colin Barry
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for repetitive histogramming
- Patent number 11,592,535
- Issue date Feb 28, 2023
- Semiconductor Components Industries, LLC
- Steven John Buckley
- G04 - HOROLOGY
Information Patent Grant
Methods and apparatus for selective histogramming
- Patent number 10,895,848
- Issue date Jan 19, 2021
- Semiconductor Components Industries, LLC
- Steven John Buckley
- G04 - HOROLOGY
Information Patent Grant
Histogram readout method and circuit for determining the time of fl...
- Patent number 10,416,293
- Issue date Sep 17, 2019
- SensL Technologies Ltd.
- Steven John Buckley
- G04 - HOROLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR REPETITIVE HISTOGRAMMING
- Publication number 20230141972
- Publication date May 11, 2023
- Semiconductor Components Industries, LLC
- Steven John BUCKLEY
- G04 - HOROLOGY
Information Patent Application
METHODS AND APPARATUS FOR HISTOGRAMMING
- Publication number 20220171037
- Publication date Jun 2, 2022
- Semiconductor Components Industries, LLC
- Colin BARRY
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR SELECTIVE HISTOGRAMMING
- Publication number 20210294274
- Publication date Sep 23, 2021
- Semiconductor Components Industries, LLC
- Steven John BUCKLEY
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR REPETITIVE HISTOGRAMMING
- Publication number 20210255285
- Publication date Aug 19, 2021
- Semiconductor Components Industries, LLC
- Steven John BUCKLEY
- G01 - MEASURING TESTING
Information Patent Application
LIDAR SYSTEM WITH DYNAMIC RESOLUTION
- Publication number 20210223372
- Publication date Jul 22, 2021
- Semiconductor Components Industries, LLC
- Ivan KOUDAR
- G01 - MEASURING TESTING
Information Patent Application
Histogram Readout Method and Circuit for Determining the Time of Fl...
- Publication number 20180164415
- Publication date Jun 14, 2018
- SENSL TECHNOLOGIES LTD.
- Steven John Buckley
- G04 - HOROLOGY